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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Valence to Core X-ray Emission SpectroscopyGallo, Erik ; Glatzel, PieterAdvanced materials (Weinheim), 2014-12, Vol.26 (46), p.7730-7746 [Periódico revisado por pares]Germany: Blackwell Publishing LtdTexto completo disponível |
| 2 |
Material Type: Artigo
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Structural change dynamics of heteroleptic Cu() complexes observed by ultrafast emission spectroscopySanga, Masashi ; Nakamura, Kosuke ; Iwamura, Munetaka ; Nozaki, Koichi ; Takeda, Hiroyuki ; Monma, Yu ; Ishitani, OsamuPhysical chemistry chemical physics : PCCP, 2023-06, Vol.25 (23), p.15873-15884 [Periódico revisado por pares]England: Royal Society of ChemistryTexto completo disponível |
| 3 |
Material Type: Artigo
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Sulfate Speciation Analysis Using Soft X‑ray Emission SpectroscopyWeinhardt, Lothar ; Hauschild, Dirk ; Steininger, Ralph ; Jiang, Nan ; Blum, Monika ; Yang, Wanli ; Heske, ClemensAnalytical chemistry (Washington), 2021-06, Vol.93 (23), p.8300-8308 [Periódico revisado por pares]Washington: American Chemical SocietyTexto completo disponível |
| 4 |
Material Type: Artigo
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Fluorescence excitation–emission matrix spectroscopy with regional integration analysis for characterizing composition and transformation of dissolved organic matter in landfill leachatesHe, Xiao-Song ; Xi, Bei-Dou ; Wei, Zi-Min ; Jiang, Yong-Hai ; Yang, Yu ; An, Da ; Cao, Jin-Ling ; Liu, Hong-LiangJournal of hazardous materials, 2011-06, Vol.190 (1), p.293-299 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
| 5 |
Material Type: Artigo
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Simulating X‑ray Emission Spectroscopy with Algebraic Diagrammatic Construction Schemes for the Polarization PropagatorFransson, Thomas ; Dreuw, AndreasJournal of chemical theory and computation, 2019-01, Vol.15 (1), p.546-556 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
| 6 |
Material Type: Artigo
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Sulfur Kβ X-ray emission spectroscopy: comparison with sulfur K-edge X-ray absorption spectroscopy for speciation of organosulfur compoundsQureshi, Muhammad ; Nowak, Stanis aw H ; Vogt, Linda I ; Cotelesage, Julien J. H ; Dolgova, Natalia V ; Sharifi, Samin ; Kroll, Thomas ; Nordlund, Dennis ; Alonso-Mori, Roberto ; Weng, Tsu-Chien ; Pickering, Ingrid J ; George, Graham N ; Sokaras, DimosthenisPhysical chemistry chemical physics : PCCP, 2021-02, Vol.23 (8), p.45-458 [Periódico revisado por pares]England: Royal Society of ChemistryTexto completo disponível |
| 7 |
Material Type: Artigo
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Characterisation of volume and surface dielectric barrier discharges in N2–O2 mixtures using optical emission spectroscopyKogelheide, Friederike ; Offerhaus, Björn ; Bibinov, Nikita ; Krajinski, Philip ; Schücke, Lars ; Schulze, Julian ; Stapelmann, Katharina ; Awakowicz, PeterPlasma processes and polymers, 2020-06, Vol.17 (6), p.n/a [Periódico revisado por pares]Weinheim: Wiley Subscription Services, IncTexto completo disponível |
| 8 |
Material Type: Artigo
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Feasibility of Valence-to-Core X‑ray Emission Spectroscopy for Tracking Transient SpeciesMarch, Anne Marie ; Assefa, Tadesse A ; Bressler, Christian ; Doumy, Gilles ; Galler, Andreas ; Gawelda, Wojciech ; Kanter, Elliot P ; Németh, Zoltán ; Pápai, Mátyás ; Southworth, Stephen H ; Young, Linda ; Vankó, GyörgyJournal of physical chemistry. C, 2015-07, Vol.119 (26), p.14571-14578 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
| 9 |
Material Type: Artigo
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Sensitive Characterization of the Graphene Transferred onto Varied Si Wafer Surfaces via Terahertz Emission Spectroscopy and Microscopy (TES/LTEM)Yang, Dongxun ; Laarman, Jesse Henri ; Tonouchi, MasayoshiMaterials, 2024-04, Vol.17 (7), p.1497 [Periódico revisado por pares]Switzerland: MDPI AGTexto completo disponível |
| 10 |
Material Type: Artigo
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Parametric optimization and spectral line selection for liquid sampling-atmospheric pressure glow discharge - optical emission spectroscopyHall, Katja A ; Marcus, R. KennethJournal of analytical atomic spectrometry, 2019-12, Vol.34 (12), p.2428-2439 [Periódico revisado por pares]London: Royal Society of ChemistryTexto completo disponível |
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