skip to main content
Idioma:
Refinado por: tipo de recurso: Anais de Congresso remover xxx: xxx remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Feasibility of Collaborative Learning and Work Between Robots and Children with Autism Spectrum Disorders
Feasibility of Collaborative Learning and Work Between Robots and Children with Autism Spectrum Disorders
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Feasibility of Collaborative Learning and Work Between Robots and Children with Autism Spectrum Disorders

Jimenez, Felix ; Yoshikawa, Tomohiro ; Furuhashi, Takeshi ; Kanoh, Masayoshi ; Nakamura, Tsuyoshi

New Frontiers in Artificial Intelligence, p.454-461 [Periódico revisado por pares]

Cham: Springer International Publishing

Sem texto completo

Citações Citado por
2
Assessing Vulnerabilities and IoT-Enabled Attacks on Smart Lighting Systems
Assessing Vulnerabilities and IoT-Enabled Attacks on Smart Lighting Systems
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Assessing Vulnerabilities and IoT-Enabled Attacks on Smart Lighting Systems

Stellios, Ioannis ; Mokos, Kostas ; Kotzanikolaou, Panayiotis

Computer Security. ESORICS 2021 International Workshops, p.199-217 [Periódico revisado por pares]

Cham: Springer International Publishing

Sem texto completo

Citações Citado por
3
Thermodynamics and Kinetics of Martensitic Transformation in Ni-Mn-based Magnetic Shape Memory Alloys
Thermodynamics and Kinetics of Martensitic Transformation in Ni-Mn-based Magnetic Shape Memory Alloys
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Thermodynamics and Kinetics of Martensitic Transformation in Ni-Mn-based Magnetic Shape Memory Alloys

Xu, Xiao ; Kainuma, Ryosuke ; Kihara, Takumi ; Ito, Wataru ; Tokunaga, Masashi ; Kanomata, Takeshi Schryvers, N. ; Van Humbeeck, J.

MATEC Web of Conferences, 2015, Vol.33, p.1004 [Periódico revisado por pares]

Les Ulis: EDP Sciences

Texto completo disponível

Citações Citado por
4
Robust 2D patterns process variability assessment using CD-SEM contour extraction offline metrology
Robust 2D patterns process variability assessment using CD-SEM contour extraction offline metrology
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Robust 2D patterns process variability assessment using CD-SEM contour extraction offline metrology

Lakcher, Amine ; Le-Gratiet, Bertrand ; Ducoté, Julien ; Fanton, Pierre ; Kiers, Ton ; Gemmink, Jan-Willem ; Hunsche, Stefan ; Prentice, Christopher ; Besacier, Maxime Ukraintsev, Vladimir A ; Sanchez, Martha I

SPIE 2017

Sem texto completo

Citações Citado por
5
Deep space optical communications
Deep space optical communications
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Deep space optical communications

Biswas, Abhijit ; Srinivasan, Meera ; Piazzolla, Sabino ; Hoppe, Daniel Boroson, Don M ; Hemmati, Hamid

SPIE 2018

Sem texto completo

Citações Citado por

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Recursos Online (1)
  2. Revistas revisadas por pares (3)

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.