Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Analysis of the Accuracy of Actuation Electronics in the Laser Interferometer Space Antenna PathfinderArmano, M. ; Audley, H. ; Baird, J. ; Born, M. ; Bortoluzzi, D. ; Cardines, N. ; Castelli, E. ; Cavalleri, A. ; Cesarini, A. ; Cruise, A. M. ; Danzmann, K. ; Silva, M. de Deus ; Dixon, G. ; Dolesi, R. ; Ferraioli, L. ; Ferroni, V. ; Freschi, M. ; Gesa, L. ; Giardini, D. ; Gibert, F. ; Giusteri, R. ; Grimani, C. ; Grzymisch, J. ; Harrison, I. ; Hartig, M.-S. ; Heinzel, G. ; Hewitson, M. ; Hollington, D. ; Hoyland, D. ; Hueller, M. ; Inchauspe, H. ; Jennrich, O. ; Jetzer, P. ; Karnesis, N. ; Kaune, B. ; Killow, C. J. ; Korsakova, N. ; López-Zaragoza, J. P. ; Maarschalkerweerd, R. ; Mance, D. ; Martin, V. ; Polo, L. Martin ; Martino, J. ; Porqueras, F. Martin ; Mateos, I. ; McNamara, P. W. ; Mendes, J. ; Mendes, L. ; Meshksar, N. ; Nofrarias, M. ; Paczkowski, S. ; Lloyd, M. Perreur ; Petiteau, A. ; Pivato, P. ; Plagnol, E. ; Castro, J. Ramos ; Reiche, J. ; Rivas, F. ; Robertson, D. I. ; Russano, G. ; Slutsky, J. ; Sopuerta, C. F. ; Sumner, T. ; Texier, D. ; Pierick, J. ten ; Thorpe, J. I. ; Vetrugno, D. ; Vitale, S. ; Wanner, G. ; Ward, H. ; Wass, P. J. ; Weber, W. J. ; Wissel, L. ; Wittchen, A. ; Zweifel, P.Review of scientific instruments, 2020-04, Vol.91 (4), p.045003-045003 [Periódico revisado por pares]Goddard Space Flight Center: AIPTexto completo disponível |
2 |
Material Type: Artigo
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Robust coupling of angiogenesis and osteogenesis by VEGF-decorated matrices for bone regenerationBurger, Maximilian G. ; Grosso, Andrea ; Briquez, Priscilla S. ; Born, Gordian M.E. ; Lunger, Alexander ; Schrenk, Flavio ; Todorov, Atanas ; Sacchi, Veronica ; Hubbell, Jeffrey A. ; Schaefer, Dirk J. ; Banfi, Andrea ; Di Maggio, NunziaActa biomaterialia, 2022-09, Vol.149, p.111-125 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
3 |
Material Type: Artigo
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Improved Reliability by Reduction of Hot-Electron Damage in the Vertical Impact-Ionization MOSFET (I-MOS)Abelein, U. ; Born, M. ; Bhuwalka, K.K. ; Schindler, M. ; Schlosser, M. ; Sulima, T. ; Eisele, I.IEEE electron device letters, 2007-01, Vol.28 (1), p.65-67 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
4 |
Material Type: Artigo
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A Modified PseudoMOS Technique to Characterize Interface Quality of SOI WafersHollt, L. ; Born, M. ; Schlosser, M. ; Eisele, I. ; Grabmeier, J. ; Huber, A.IEEE transactions on electron devices, 2007-10, Vol.54 (10), p.2685-2689 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
5 |
Material Type: Artigo
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Radiation transfer in dense edge plasmas and divertors: experimental and recent computational resultsReiter, D ; Wiesen, S ; Born, MJournal of nuclear materials, 2003-03, Vol.313, p.845-851 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
6 |
Material Type: Artigo
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Capability of thermodynamic calculation in the development of alloys for deposition of corrosion-protection coatings via thermal sprayingBorn, M. ; Korb, J. ; Rafaja, D. ; Dopita, M. ; Schülein, R. W.Materials and corrosion, 2007-10, Vol.58 (9), p.673-680 [Periódico revisado por pares]Weinheim: WILEY-VCH VerlagTexto completo disponível |
7 |
Material Type: Artigo
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In-flight testing of the injection of the LISA Pathfinder test mass into a geodesicBortoluzzi, D. ; Vignotto, D. ; Zambotti, A. ; Armano, M. ; Audley, H. ; Baird, J. ; Binetruy, P. ; Born, M. ; Castelli, E. ; Cavalleri, A. ; Cesarini, A. ; Cruise, A.M. ; Danzmann, K. ; de Deus Silva, M. ; Diepholz, I. ; Dixon, G. ; Dolesi, R. ; Ferraioli, L. ; Ferroni, V. ; Fitzsimons, E.D. ; Freschi, M. ; Gesa, L. ; Gibert, F. ; Giardini, D. ; Giusteri, R. ; Grimani, C. ; Grzymisch, J. ; Harrison, I. ; Hartig, M.-S. ; Heinzel, G. ; Hewitson, M. ; Hollington, D. ; Hoyland, D. ; Hueller, M. ; Inchauspé, H. ; Jennrich, O. ; Jetzer, P. ; Karnesis, N. ; Kaune, B. ; Korsakova, N. ; Killow, C.J. ; Lobo, J.A. ; Liu, L. ; López-Zaragoza, J.P. ; Maarschalkerweerd, R. ; Mance, D. ; Meshksar, N. ; Martín, V. ; Martin-Polo, L. ; Martino, J. ; Martin-Porqueras, F. ; McNamara, P.W. ; Mendes, J. ; Mendes, L. ; Nofrarias, M. ; Paczkowski, S. ; Perreur-Lloyd, M. ; Petiteau, A. ; Pivato, P. ; Plagnol, E. ; Ramos-Castro, J. ; Reiche, J. ; Robertson, D.I. ; Rivas, F. ; Russano, G. ; Slutsky, J. ; Sopuerta, C.F. ; Sumner, T. ; Texier, D. ; Thorpe, J.I. ; Vetrugno, D. ; Vitale, S. ; Wanner, G. ; Ward, H. ; Wass, P.J. ; Weber, W.J. ; Wissel, L. ; Wittchen, A. ; Zweifel, P. ; Zanoni, CarloAdvances in space research, 2021-01, Vol.67 (1), p.504-520 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
8 |
Material Type: Artigo
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Sub-50 nm high performance PDBFET with impact ionizationBorn, M. ; Abelein, U. ; Bhuwalka, K.K. ; Schindler, M. ; Schmidt, M. ; Ludsteck, A. ; Schulze, J. ; Eisele, I.Thin solid films, 2006-06, Vol.508 (1), p.323-325 [Periódico revisado por pares]Lausanne: Elsevier B.VTexto completo disponível |
9 |
Material Type: Artigo
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IMPACT OF FACE VALIDITY AND INFORMATION ABOUT THE ASSESSMENT PROCESS ON TEST MOTIVATION AND PERFORMANCEDerous, E. ; Bron, M. PhTravail humain (Paris), 2005-12, Vol.68 (4), p.317-336 [Periódico revisado por pares]Paris: Presses Universitaires de FranceTexto completo disponível |
10 |
Material Type: Ata de Congresso
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Towards executable models: transforming EDOC behavior models to CORBA and BPELKath, O.Proceedings. Eighth IEEE International Enterprise Distributed Object Computing Conference, 2004. EDOC 2004, 2004, p.267-274IEEETexto completo disponível |