Pattern recognition in the HADES spectrometer: an application of FPGA technology in nuclear and particle physics

Frohlich, I. ; Gabriel, A. ; Kirschner, D. ; Lehnert, J. ; Lins, E. ; Petri, M. ; Perez-Cavalcanti, T. ; Ritman, J. ; Schafer, D. ; Toia, A. ; Traxler, M. ; Kuehn, W.

New York, NY: IEEE

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Di-electron measurements in C+C reactions at 2 GeV.A with HADES

Eberl, T. ; Agakishiev, G. ; Agodi, C. ; Alvarez-Pol, H. ; Bałanda, A. ; Bellia, G. ; Bielcik, J. ; Böhmer, M. ; Boyard, J.L. ; Braun-Munzinger, P. ; Chernenko, S. ; Christ, T. ; Coniglione, R. ; Djeridi, R. ; Dohrmann, F. ; Durán, I. ; Fabbietti, L. ; Fateev, O. ; Finocchiaro, P. ; Friese, J. ; Fröhlich, I. ; Garzón, J.A. ; Gernhäuser, R. ; Golubeva, M. ; González-Díaz, D. ; Grosse, E. ; Guber, F. ; Hennino, T. ; Hlavac, S. ; Holzmann, R. ; Ierusalimov, A. ; Iori, I. ; Jaskuła, M. ; Jurkovic, M. ; Kämpfer, B. ; Kanaki, K. ; Karavicheva, T. ; Koenig, I. ; Koenig, W. ; Kolb, B.W. ; Kotte, R. ; Kotulic-Bunta, J. ; Krücken, R. ; Kugler, A. ; Kühn, W. ; Kulessa, R. ; Kurepin, A. ; Lang, S. ; Lehnert, J. ; Maiolino, C. ; Markert, J. ; Metag, V. ; Mousa, J. ; Münch, M. ; Müntz, C. ; Naumann, L. ; Novotny, R. ; Novotný, J. ; Otwinowski, J. ; Pachmayer, Y.C. ; Pant, L.M. ; Pechenov, V. ; Pérez, T. ; Pietraszko, J. ; Pleskač, R. ; Pospíšil, V. ; Przygoda, W. ; Rabin, N. ; Ramstein, B. ; Reshetin, A. ; Ritman, J. ; Roy-Stephan, M. ; Rustamov, A. ; Sadovsky, A. ; Sailer, B. ; Salabura, P. ; Sánchez, M. ; Sapienza, P. ; Schmah, A. ; Simon, R. ; Smolyankin, V. ; Smykov, L. ; Spataro, S. ; Spruck, B. ; Stroebele, H. ; Stroth, J. ; Sturm, C. ; Sudol, M. ; Tlustý, P. ; Toia, A. ; Traxler, M. ; Tsertos, H. ; Wagner, V. ; Wiśniowski, M. ; Wójcik, T. ; Wüstenfeld, J. ; Zanevsky, Y. ; Žovinec, D. ; Zumbruch, P.

Elsevier

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First Run II results from ALICE

Toia, Alberica Barillari, T. ; Menke, S. ; Bethke, S. ; Kluth, S.

Les Ulis: EDP Sciences

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Particle production in p–Pb collisions with ALICE at the LHC

Toia, Alberica Pirrone, S. ; Spitaleri, C. ; La Cognata, M. ; Greco, V. ; Rizzo, F.

Les Ulis: EDP Sciences

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ALICE @ LHC: Status and Highlights

Toia, Alberica Creanza, D.M. ; Corianò, C. ; Nappi, E. ; Bruno, G.E. ; Colangelo, P. ; Spagnolo, S. ; Chiodini, G. ; De Fazio, F.

Les Ulis: EDP Sciences

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Improving the Figure-of-Merit of Integrated Solid-State Diodes through the Use of Nanostructured Porous Silicon

Strambini, Lucanos M ; Marchesi, Marco ; Sambi, Marco ; Toia, Fabrizio Fausto Renzo ; Mariani, Simone Dario ; Morelli, Marco ; Barillaro, Giuseppe

The Electrochemical Society, Inc

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Bulk properties of Pb-Pb collisions at √sNN = 2.76 TeV measured by ALICE

TOIA, Alberica

Bristol: Institute of Physics

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A novel 0.35µm 800V BCD technology platform for offline applications

Venturato, M. ; Cantone, G. ; Ronchi, F. ; Toia, F.

IEEE

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CAREER MANAGEMENT IN SCHOOL ORGANISATIONS: CASE STUDY

Drobot, L ; Visan, A ; Rotaru, I ; Nitulescu, L ; Chis-Toia, D

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EQUITY AND QUALITY IN EDUCATIONAL POLICIES

Drobot, L ; Anghel, C ; Constantin, A ; Pasca, D ; Chis-Toia, D

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