Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Transfer, maintenance, and expression of bacterial Ti-plasmid DNA in plant cells transformed with A. tumefaciensSchell, Jeff ; Van Montagu, MarcBrookhaven National Laboratory 1977Sem texto completo |
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2 |
Material Type: Ata de Congresso
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CONSTRUCTING A PRODUCT ARCHITECTURE STRATEGY AND EFFECTS (PASE) MATRIX FOR EVALUATION AND SELECTION OF PRODUCT ARCHITECTURESRice, Scott E. ; McKinnon, Samuel A. ; Sannar, Benjamin C. ; Mattson, Christopher A. ; Sorensen, Carl D. ; Anderson, Michael L.Proceedings of the Design Society, 2023, Vol.3, p.1087-1096Cambridge: Cambridge University PressSem texto completo |
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3 |
Material Type: Ata de Congresso
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The SEMATECH high-NA actinic reticle review project (SHARP) EUV mask-imaging microscopeGoldberg, Kenneth A ; Mochi, Iacopo ; Benk, Markus P ; Lin, Chihcheng ; Allezy, Arnaud P ; Dickinson, Michael ; Cork, Carl W ; Macdougall, James B ; Anderson, Erik H ; Chao, Weilun ; Salmassi, Farhad ; Gullikson, Eric M ; Zehm, Daniel ; Vytla, Vamsi ; Cork, William ; DePonte, Jason ; Picchi, Gino ; Pekedis, Ahmet ; Katayanagi, Takeshi ; Jones, Michael S ; Martin, Elizabeth ; Naulleau, Patrick P ; Rekawa, Senajith B Ackmann, Paul W ; Faure, Thomas BProc. SPIE, 2013, Vol.8880, p.88800T-88800T-9United States: SPIESem texto completo |
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4 |
Material Type: Ata de Congresso
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OTU-002 HLA-DQA1 contributes to the development of antibodies to anti-TNF therapy in crohn’s diseaseSazonovs, Aleksejs ; Kennedy, Nicholas A ; Bewshea, Claire ; Moutsianas, Loukas ; Walker, Gareth J ; Lange, Katrina De ; Goodhand, James R ; Anderson, Carl ; Barrett, Jeff ; Ahmad, TariqGut, 2018, Vol.67 (Suppl 1), p.A52 [Periódico revisado por pares]Texto completo disponível |
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5 |
Material Type: Ata de Congresso
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Commissioning an EUV mask microscope for lithography generations reaching 8 nmGoldberg, Kenneth A ; Mochi, Iacopo ; Benk, Markus ; Allezy, Arnaud P ; Dickinson, Michael R ; Cork, Carl W ; Zehm, Daniel ; Macdougall, James B ; Anderson, Erik ; Salmassi, Farhad ; Chao, Weilun L ; Vytla, Vamsi K ; Gullikson, Eric M ; DePonte, Jason C ; Jones, M. S. Gideon ; Van Camp, Douglas ; Gamsby, Jeffrey F ; Ghiorso, William B ; Huang, Hanjing ; Cork, William ; Martin, Elizabeth ; Van Every, Eric ; Acome, Eric ; Milanovic, Veljko ; Delano, Rene ; Naulleau, Patrick P ; Rekawa, Senajith B Naulleau, Patrick PProc. SPIE, 2013, Vol.8679, p.867919-867919-10United States: SPIESem texto completo |
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6 |
Material Type: Ata de Congresso
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TILE64 - Processor: A 64-Core SoC with Mesh InterconnectBell, Shane ; Edwards, Bruce ; Amann, John ; Conlin, Rich ; Joyce, Kevin ; Leung, Vince ; MacKay, John ; Reif, Mike ; Bao, Liewei ; Brown, John ; Mattina, Matthew ; Miao, Chyi-Chang ; Ramey, Carl ; Wentzlaff, David ; Anderson, Walker ; Berger, Ethan ; Fairbanks, Nat ; Khan, Durlov ; Montenegro, Froilan ; Stickney, Jay ; Zook, John2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, 2008, p.88-598IEEETexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Occupancy Forecasting for Dynamic Building ControlsAnderson, Tahj ; Ehrett, Carl2023 IEEE Conference on Artificial Intelligence (CAI), 2023, p.76-77IEEESem texto completo |
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8 |
Material Type: Ata de Congresso
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Design and application of compliant mechanisms for morphing aircraft structuresKota, Sridhar ; Hetrick, Joel A ; Osborn, Russell ; Paul, Donald ; Pendleton, Edmund ; Flick, Peter ; Tilmann, CarlSPIE proceedings series, 2003, Vol.5054, p.24-33Bellingham WA: SPIETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Beyond innovation: dealing with the risks and complexity of processor design in 22nmAnderson, Carl2009 46th ACM/IEEE Design Automation Conference, 2009, p.103-103ACMTexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Overview and status of the 0.5NA EUV microfield exposure tool at Berkeley LabAnderson, Christopher ; Allezy, Arnaud ; Chao, Weilun ; Cork, Carl ; Cork, Will ; Delano, Rene ; DePonte, Jason ; Dickinson, Michael ; Gaines, Geoff ; Gamsby, Jeff ; Gullikson, Eric ; Jones, Gideon ; Meyers, Stephen ; Miyakawa, Ryan ; Naulleau, Patrick ; Rekawa, Senajith ; Salmassi, Farhad ; Vollmer, Brandon ; Zehm, Daniel ; Zhu, Wenhua Goldberg, Kenneth AUnited States: SPIE 2019Sem texto completo |