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Refinado por: Nome da Publicação: Ieee Access remover assunto: Task Analysis remover
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A New Arithmetic Optimization Algorithm for Solving Real-World Multiobjective CEC-2021 Constrained Optimization Problems: Diversity Analysis and Validations
A New Arithmetic Optimization Algorithm for Solving Real-World Multiobjective CEC-2021 Constrained Optimization Problems: Diversity Analysis and Validations
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A New Arithmetic Optimization Algorithm for Solving Real-World Multiobjective CEC-2021 Constrained Optimization Problems: Diversity Analysis and Validations

Premkumar, Manoharan ; Jangir, Pradeep ; Kumar, Balan Santhosh ; Sowmya, Ravichandran ; Alhelou, Hassan Haes ; Abualigah, Laith ; Yildiz, Ali Riza ; Mirjalili, Seyedali

IEEE access, 2021, Vol.9, p.84263-84295 [Periódico revisado por pares]

Piscataway: IEEE

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Toward a Holistic Privacy Requirements Engineering Process: Insights From a Systematic Literature Review
Toward a Holistic Privacy Requirements Engineering Process: Insights From a Systematic Literature Review
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Toward a Holistic Privacy Requirements Engineering Process: Insights From a Systematic Literature Review

Herwanto, Guntur Budi ; Ekaputra, Fajar J. ; Quirchmayr, Gerald ; Tjoa, A. Min

IEEE access, 2024, Vol.12, p.47518-47542 [Periódico revisado por pares]

Piscataway: IEEE

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3
Comprehensive Review of Artificial Neural Network Applications to Pattern Recognition
Comprehensive Review of Artificial Neural Network Applications to Pattern Recognition
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Comprehensive Review of Artificial Neural Network Applications to Pattern Recognition

Abiodun, Oludare Isaac ; Kiru, Muhammad Ubale ; Jantan, Aman ; Omolara, Abiodun Esther ; Dada, Kemi Victoria ; Umar, Abubakar Malah ; Linus, Okafor Uchenwa ; Arshad, Humaira ; Kazaure, Abdullahi Aminu ; Gana, Usman

IEEE access, 2019, Vol.7, p.158820-158846 [Periódico revisado por pares]

Piscataway: IEEE

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4
Deep Learning for Change Detection in Remote Sensing Images: Comprehensive Review and Meta-Analysis
Deep Learning for Change Detection in Remote Sensing Images: Comprehensive Review and Meta-Analysis
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Deep Learning for Change Detection in Remote Sensing Images: Comprehensive Review and Meta-Analysis

Khelifi, Lazhar ; Mignotte, Max

IEEE access, 2020, Vol.8, p.126385-126400 [Periódico revisado por pares]

Piscataway: IEEE

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5
A Survey of Software Clone Detection From Security Perspective
A Survey of Software Clone Detection From Security Perspective
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A Survey of Software Clone Detection From Security Perspective

Zhang, Haibo ; Sakurai, Kouichi

IEEE access, 2021, Vol.9, p.48157-48173 [Periódico revisado por pares]

Piscataway: IEEE

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6
LSAR: Multi-UAV Collaboration for Search and Rescue Missions
LSAR: Multi-UAV Collaboration for Search and Rescue Missions
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LSAR: Multi-UAV Collaboration for Search and Rescue Missions

Alotaibi, Ebtehal Turki ; Alqefari, Shahad Saleh ; Koubaa, Anis

IEEE access, 2019, Vol.7, p.55817-55832 [Periódico revisado por pares]

Piscataway: IEEE

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7
Two-Stage Topic Extraction Model for Bibliometric Data Analysis Based on Word Embeddings and Clustering
Two-Stage Topic Extraction Model for Bibliometric Data Analysis Based on Word Embeddings and Clustering
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Two-Stage Topic Extraction Model for Bibliometric Data Analysis Based on Word Embeddings and Clustering

Onan, Aytug

IEEE access, 2019, Vol.7, p.145614-145633 [Periódico revisado por pares]

Piscataway: IEEE

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8
Hate Speech on Twitter: A Pragmatic Approach to Collect Hateful and Offensive Expressions and Perform Hate Speech Detection
Hate Speech on Twitter: A Pragmatic Approach to Collect Hateful and Offensive Expressions and Perform Hate Speech Detection
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Hate Speech on Twitter: A Pragmatic Approach to Collect Hateful and Offensive Expressions and Perform Hate Speech Detection

Watanabe, Hajime ; Bouazizi, Mondher ; Ohtsuki, Tomoaki

IEEE access, 2018-01, Vol.6, p.13825-13835 [Periódico revisado por pares]

Piscataway: IEEE

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9
Threat of Adversarial Attacks on Deep Learning in Computer Vision: A Survey
Threat of Adversarial Attacks on Deep Learning in Computer Vision: A Survey
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Threat of Adversarial Attacks on Deep Learning in Computer Vision: A Survey

Akhtar, Naveed ; Mian, Ajmal

IEEE access, 2018-01, Vol.6, p.14410-14430 [Periódico revisado por pares]

Piscataway: IEEE

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10
Criticality Analysis for the Verification and Validation of Automated Vehicles
Criticality Analysis for the Verification and Validation of Automated Vehicles
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Criticality Analysis for the Verification and Validation of Automated Vehicles

Neurohr, Christian ; Westhofen, Lukas ; Butz, Martin ; Bollmann, Martin Herbert ; Eberle, Ulrich ; Galbas, Roland

IEEE access, 2021, Vol.9, p.18016-18041 [Periódico revisado por pares]

Piscataway: IEEE

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