Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Electrical Characterization of Organic Electronic Materials and DevicesStallinga, PeterNewark: Wiley 2009Texto completo disponível |
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2 |
Material Type: Artigo de Congresso
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Shot noise and s-o coherent of entangled and spin polarized electronsJosé Carlos Egues G Burkard; D Saraga; J Schliemann; D Loss; International School and Conference on Semiconductor Spitronics and Quantum Information Technology - SPINTECH (3. 2005 Awaji Island)Abstract Notebook Awaji Island, 2005Awaji Island 2005Localização: IFSC - Inst. Física de São Carlos (PROD011980 ) e outros locais(Acessar) |
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3 |
Material Type: Livro
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Concise Encyclopedia of Semiconducting Materials and Related TechnologiesMahajan, S ; Kimerling, L. CSan Diego: Elsevier Science & Technology 1992Texto completo disponível |
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4 |
Material Type: Livro
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Semiconductor Material and Device CharacterizationSchroder, Dieter KJohn Wiley & Sons 2006Texto completo disponível |
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5 |
Material Type: Livro
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Physics of Low-Dimensional Semiconductor StructuresButcher, Paul N ; March, Norman H ; Tosi, Mario PNew York, NY: Springer 1993Texto completo disponível |
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6 |
Material Type: Livro
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Silicon-on-Insulator Technology: Materials to VLSIColinge, Jean-PierreBoston, MA: Springer US 2004Texto completo disponível |
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7 |
Material Type: Livro
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Devices Based on Low-Dimensional Semiconductor StructuresBalkanski, MDordrecht: Springer Netherlands 1996Texto completo disponível |
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8 |
Material Type: Livro
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Electrical Characterization of Silicon-On-Insulator Materials and DevicesCristoloveanu, Sorin ; Li, ShengBoston, MA: Springer 1995Texto completo disponível |
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9 |
Material Type: Livro
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Technology and Applications of Amorphous SiliconStreet, Robert ABerlin, Heidelberg: Springer Berlin / Heidelberg 2000Texto completo disponível |
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10 |
Material Type: Livro
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Simulation Techniques and Solutions for Mixed-Signal Coupling in Integrated CircuitsVerghese, Nishath K ; Schmerbeck, Timothy J ; Allstot, David JNew York, NY: Springer 1995Texto completo disponível |