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Stochastic processes applied to physics proceedings of the international school held in Santander, Spain 10-14 September 1984
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Stochastic processes applied to physics proceedings of the international school held in Santander, Spain 10-14 September 1984

L Pesquera; M. A Rodríguez; Universidad Internacional Menéndez Pelayo; Grupo Interuniversitario de Física Teórica (Spain); International School on Stochastic Processes Applied to Physics (1984 Santander, Spain)

Singapore World Scientific Philadelphia c1985

Localização: IF - Instituto de Física    (530.159206 I61s )(Acessar)

2
Integral methods in science and engineering
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Integral methods in science and engineering

Perez, Maria Eugenia

Birkhauser 2009

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3
The integration and engineering of the ATLAS SemiConductor Tracker Barrel
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Artigo
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The integration and engineering of the ATLAS SemiConductor Tracker Barrel

Atkinson, T ; Austin, N ; Barclay, P ; Benes, J ; Bethke, S ; Bouhova-Thacker, E V ; Renstrom, P A Bruckman de ; Carter, J R ; Catmore, J R ; Ciocio, A ; Civera, J V ; Clark, A ; Cox, J ; Dalmau, J ; Danielsen, K M ; D'Auria, S ; Jong, P de ; Dehchar, M D ; Demirköz, B ; Dixon, S D ; Dobson, E ; Dolezal, Z ; Donega, M ; Doubrava, M ; Eklund, L M ; Ely, R ; Fadeyev, V ; Ferguson, D ; Ford, P ; Freestone, J ; Ghodbane, N ; Gonzalez, S ; Goodrick, M J ; Gornicki, E ; Grosse-Knetter, J ; Härtel, R ; Hara, K ; Hartjes, F G ; Hayler, T ; Hodgkinson, M C ; Holy, T ; Hughes, G ; Ibbotson, M ; Ikegami, Y ; Jakubek, J ; Jarron, P ; Johansson, P ; Jones, T J ; Jones, T W ; Joos, D ; Jusko, J ; Kartvelishvili, V ; Kholodenko, A G ; Kluth, S ; Kohriki, T ; Kondo, T ; Lacuesta, V R ; Lefevre, R P ; Leney, K J C ; Lester, C G ; Lindsay, S W ; Lutz, G ; Macina, D ; Mandić, I ; Garcia, S Marti i ; McMahon, T J ; Messmer, I ; Mitsou, V A ; Modesto, P ; Morin, J ; Morrissey, M C ; Moser, H G ; Moszczynski, A ; Nagai, Y ; Nisius, R ; Olcese, M ; Pataraia, S ; Pater, J R ; Pellegrini, G ; Pernegger, H ; Prokofiev, K ; Ratoff, P N ; Seiden, A ; Sfyrla, A ; Sloan, T J ; Spieler, H ; Stapnes, S ; Stodulski, M ; Stugu, B ; Szczygiel, R R ; Taylor, G N ; Terada, S ; Tyndel, M ; Ukegawa, F ; Vickey, T ; Wallny, R S ; Ward, C P ; Webb, P ; Webel, M ; Weilhammer, P M

Journal of instrumentation, 2008-10, Vol.3 (10), p.P10006-P10006 [Periódico revisado por pares]

IOP Publishing

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