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1
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers
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Graphics recognition recent advances and perspectives : 5th international workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003 : revised selected papers

GREC 2003 (2003 Barcelona, Spain) Josep Llad os 1968; Young-Bin Kwon

Berlin Springer New York c2004

Acesso online. A biblioteca também possui exemplares impressos.

2
Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings
Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings
Material Type:
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Progress in pattern recognition, image analysis and applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla Mexico, October 26-29, 2004 : proceedings

Iberoamerican Congress on Pattern Recognition (9th 2004 Puebla, Mexico) Alberto Sanfeliu; Jos e Francisco Mart inez Trinidad; Jes us Ariel Carrasco Ochoa

Berlin Springer New York, N.Y 2004

Acesso online. A biblioteca também possui exemplares impressos.

3
Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers
Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers
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Graphics recognition ten years review and future perspectives : 6th international workshop GREC 2005, Hong Kong, China, August 25-26, 2005 : revised selected papers

International Workshop on Graphics Recognition (6th 2005 Hong Kong, China) Wenyin Liu; Josep Llad os 1968; International Association for Pattern Recognition

Berlin Springer New York c2006

Localização: ICMC - Inst. Ciên. Mat. Computação    (68-02 LNCS v.3926 ) e outros locais(Acessar)

4
Pattern recognition and image analysis second Iberian conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005 proceedings
Pattern recognition and image analysis second Iberian conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005 proceedings
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Pattern recognition and image analysis second Iberian conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005 proceedings

IbPRIA 2005 (2005 Estoril, Portugal) Jorge S Marques; N P erez de la Blanca; Pedro Pina

Berlin Springer New York 2005

Acesso online. A biblioteca também possui exemplares impressos.

5
Document analysis systems VII 7th international workshop, DAS 2006, Nelson, New Zealand, February 13-15, 2006 : proceedings
Document analysis systems VII 7th international workshop, DAS 2006, Nelson, New Zealand, February 13-15, 2006 : proceedings
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Document analysis systems VII 7th international workshop, DAS 2006, Nelson, New Zealand, February 13-15, 2006 : proceedings

DAS 2006 (2006 Nelson, N.Z.) Horst Bunke; A. Lawrence Spitz

Berlin Springer New York c2006

Localização: ICMC - Inst. Ciên. Mat. Computação    (68-02 LNCS v.3872 ) e outros locais(Acessar)

6
Machine learning and data mining in pattern recognition 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11 2005 : proceedings
Machine learning and data mining in pattern recognition 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11 2005 : proceedings
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Machine learning and data mining in pattern recognition 4th international conference, MLDM 2005, Leipzig, Germany, July 9-11 2005 : proceedings

MLDM 2005 (2005 Leipzig, Germany) Petra Perner; Atsushi Imiya; Industrial Conference on Data Mining (2005 Leipzig, Germany)

Berlin Springer New York c2005

Acesso online. A biblioteca também possui exemplares impressos.

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  1. Recursos Online (4)

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Deste Autor:

  1. Llad os, J
  2. Imiya, A
  3. GREC 2003
  4. IbPRIA 2005
  5. Liu, W

Neste Assunto:

  1. Computação Gráfica (Congressos)
  2. Analyse D'Images
  3. Mustererkennung
  4. Traitement D'Images
  5. Reconnaissance Des Formes

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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