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The MUSE second-generation VLT instrument
The MUSE second-generation VLT instrument
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

The MUSE second-generation VLT instrument

BACON, R ; ACCARDO, M ; CAILLIER, P ; CAPOANI, L ; CAROLLO, C. M ; CONTINI, T ; COUDERC, P ; DAGUISE, E ; DEIRIES, S ; DELABRE, B ; DREIZLER, S ; DUBOIS, J ; ADJALI, L ; DUPIEUX, M ; DUPUY, C ; EMSELLEM, E ; FECHNER, T ; FLEISCHMANN, A ; FRANCOIS, M ; GALLOU, G ; GHARSA, T ; GLINDEMANN, A ; GOJAK, D ; ANWAND, H ; GUIDERDONI, B ; HANSALI, G ; HAHN, T ; JARNO, A ; KELZ, A ; KOEHLER, C ; KOSMALSKI, J ; LAURENT, F ; LE FLOCH, M ; LILLY, S. J ; BAUER, S ; LIZON, J.-L ; LOUPIAS, M ; MANESCAU, A ; MONSTEIN, C ; NICKLAS, H ; OLAYA, J.-C ; PARES, L ; PASQUINI, L ; PECONTAL-ROUSSET, A ; PELLO, R ; BISWAS, I ; PETIT, C ; POPOW, E ; REISS, R ; REMILLIEUX, A ; RENAULT, E ; ROTH, M ; RUPPRECHT, G ; SERRE, D ; SCHAYE, J ; SOUCAIL, G ; BLAIZOT, J ; BOUDON, D ; BRAU-NOGUE, S ; BRINCHMANN, J

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7735

Bellingham, Wash: SPIE

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2
High speed measurements using fiber-optic Bragg gratings
High speed measurements using fiber-optic Bragg gratings
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High speed measurements using fiber-optic Bragg gratings

BENTEROU, Jerry ; MAY, Chadd ; UDD, Eric ; MIHAILOV, Stephen J ; PING LU

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.8028

Bellingham, Wash: SPIE

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3
The Pan-STARRS wide-field optical/NIR imaging survey
The Pan-STARRS wide-field optical/NIR imaging survey
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

The Pan-STARRS wide-field optical/NIR imaging survey

KAISER, Nick ; BURGETT, William ; CHAMBERS, Ken ; DENNEAU, Larry ; HEASLEY, Jim ; JEDICKE, Robert ; MAGNIER, Eugene ; MORGAN, Jeff ; ONAKA, Peter ; TONRY, John

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7733

Bellingham, Wash: SPIE

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4
ESPRESSO: the Echelle spectrograph for rocky exoplanets and stable spectroscopic observations
ESPRESSO: the Echelle spectrograph for rocky exoplanets and stable spectroscopic observations
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ESPRESSO: the Echelle spectrograph for rocky exoplanets and stable spectroscopic observations

PEPE, Francesco A ; CRISTIANI, Stefano ; CIRAMI, Roberto ; COELHO, Joao ; COMARI, Maurizio ; CORETTI, Igor ; DE CAPRIO, Vincenzo ; DEKKER, Hans ; DELABRE, Bernard ; DI MARCANTONIO, Paolo ; D'ODORICO, Valentina ; FLEURY, Michel ; REBOLO LOPEZ, Rafael ; GARCIA LOPEZ, Ramòn ; HERREROS LINARES, José Miguel ; HUGHES, Ian ; IWERT, Olaf ; LIMA, Jorge ; LIZON, Jean-Louis ; LO CURTO, Gaspare ; LOVIS, Christophe ; MANESCAU, Antonio ; MARTINS, Carlos ; SANTOS, Nuno C ; MEGEVAND, Denis ; MOITINHO, André ; MOLARO, Paolo ; MONTEIRO, Mario ; MONTEIRO, Manuel ; MORDASINI, Christoph ; PASQUINI, Luca ; QUELOZ, Didier ; RASILLA, José Luis ; REBORDAO, Jose Manuel ; AMORIM, Antonio ; SANTANA TSCHUDI, Samuel ; SANTIN, Paolo ; SOSNOWSKA, Danuta ; SPANO, Paolo ; TENEGI, Fabio ; UDRY, Stéphane ; VANZELLA, Eros ; VIEL, Matteo ; ZAPATERO OSORIO, Maria Rosa ; ZERBI, Filippo ; AVILA, Gerardo ; BENZ, Willy ; BONIFACIO, Piercarlo ; CABRAL, Alexandre ; CARVAS, Pedro

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7735

Bellingham, Wash: SPIE

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5
SPHERE IFS: the spectro differential imager of the VLT for exoplanets search
SPHERE IFS: the spectro differential imager of the VLT for exoplanets search
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SPHERE IFS: the spectro differential imager of the VLT for exoplanets search

Claudi, R. U ; Turatto, M ; Gratton, R. G ; Antichi, J ; Bonavita, M ; Bruno, P ; Cascone, E ; De Caprio, V ; Desidera, S ; Giro, E ; Mesa, D ; Scuderi, S ; Dohlen, K ; Beuzit, J. L ; Puget, P

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.7014, p.70143E-70143E-11

Bellingham WA: SPIE

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6
Steganalysis in high dimensions: Fusing classifiers built on random subspaces
Steganalysis in high dimensions: Fusing classifiers built on random subspaces
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Steganalysis in high dimensions: Fusing classifiers built on random subspaces

KODOVSKY, Jan ; FRIDRICH, Jessica

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.7880

Bellingham WA: SPIE

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7
The infra-red dual imaging and spectrograph for SPHERE: design and performance
The infra-red dual imaging and spectrograph for SPHERE: design and performance
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The infra-red dual imaging and spectrograph for SPHERE: design and performance

Dohlen, Kjetil ; Langlois, Maud ; Saisse, Michel ; Hill, Lucien ; Origne, Alain ; Jacquet, Marc ; Fabron, Christophe ; Blanc, Jean-Claude ; Llored, Marc ; Carle, Michael ; Moutou, Claire ; Vigan, Arthur ; Boccaletti, Anthony ; Carbillet, Marcel ; Mouillet, David ; Beuzit, Jean-Luc

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.7014, p.70143L-70143L-10

Bellingham WA: SPIE

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8
OpenOrd: An Open-Source Toolbox for Large Graph Layout
OpenOrd: An Open-Source Toolbox for Large Graph Layout
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OpenOrd: An Open-Source Toolbox for Large Graph Layout

MARTIN, Shawn ; BROWN, W. Michael ; KLAVANS, Richard ; BOYACK, Kevin W

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.7868

Springfield VA: IS&T

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9
The Multi-Object Double Spectrographs for the Large Binocular Telescope
The Multi-Object Double Spectrographs for the Large Binocular Telescope
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The Multi-Object Double Spectrographs for the Large Binocular Telescope

POGGE, R. W ; ATWOOD, B ; PAPPALARDO, D. P ; STEINBRECHER, D. P ; TEIGA, E. J ; ZHELEM, R ; BREWER, D. F ; BYARD, P. L ; DERWENT, M. A ; GONZALEZ, R ; MARTINI, P ; MASON, J. A ; O'BRIEN, T. P ; OSMER, P. S

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7735

Bellingham, Wash: SPIE

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10
On understanding the figures of merit for detection and measurement of x-ray polarization
On understanding the figures of merit for detection and measurement of x-ray polarization
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On understanding the figures of merit for detection and measurement of x-ray polarization

WEISSKOPF, Martin C ; ELSNER, Ronald F ; O'DELL, Stephen L

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7732

Bellingham, Wash: SPIE

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