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Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened CircuitryWarren, K.M. ; Sternberg, A.L. ; Weller, R.A. ; Baze, M.P. ; Massengill, L.W. ; Reed, R.A. ; Mendenhall, M.H. ; Schrimpf, R.D.IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2886-2894 [Periódico revisado por pares]New York: IEEETexto completo disponível |