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Three-dimensional reconstruction of super-resolved white-light interferograms based on deep learning
Three-dimensional reconstruction of super-resolved white-light interferograms based on deep learning
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Three-dimensional reconstruction of super-resolved white-light interferograms based on deep learning

Xin, Lei ; Liu, Xin ; Yang, Zhongming ; Zhang, Xingyu ; Gao, Zhishan ; Liu, Zhaojun

Optics and lasers in engineering, 2021-10, Vol.145, p.106663, Article 106663 [Periódico revisado por pares]

Elsevier Ltd

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A robust white-light interference signal leakage sampling correction method based on wavelet transform
A robust white-light interference signal leakage sampling correction method based on wavelet transform
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A robust white-light interference signal leakage sampling correction method based on wavelet transform

Xin, Lei ; Liu, Zhenhua ; Dou, Jiantai ; Yang, Zhongming ; Zhang, Xingyu ; Liu, Zhaojun

Optics and lasers in engineering, 2020-10, Vol.133, p.106156, Article 106156 [Periódico revisado por pares]

Elsevier Ltd

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Removing light interference to improve character recognition rate by using single-pixel imaging
Removing light interference to improve character recognition rate by using single-pixel imaging
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Removing light interference to improve character recognition rate by using single-pixel imaging

Gao, Xicheng ; Deng, Huaxia ; Ma, Mengchao ; Guan, Qingtian ; Sun, Qianzhen ; Si, Wuhan ; Zhong, Xiang

Optics and lasers in engineering, 2021-05, Vol.140, p.106517, Article 106517 [Periódico revisado por pares]

Elsevier Ltd

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4
Anti-Hong–Ou–Mandel interference by coherent perfect absorption of entangled photons
Anti-Hong–Ou–Mandel interference by coherent perfect absorption of entangled photons
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Anti-Hong–Ou–Mandel interference by coherent perfect absorption of entangled photons

Vetlugin, Anton N ; Guo, Ruixiang ; Soci, Cesare ; Zheludev, Nikolay I

New journal of physics, 2022-12, Vol.24 (12), p.122001 [Periódico revisado por pares]

Bristol: IOP Publishing

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5
Distributed Partial Discharge Locating and Detecting Scheme Based on Optical Fiber Rayleigh Backscattering Light Interference
Distributed Partial Discharge Locating and Detecting Scheme Based on Optical Fiber Rayleigh Backscattering Light Interference
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Distributed Partial Discharge Locating and Detecting Scheme Based on Optical Fiber Rayleigh Backscattering Light Interference

Zhou, Zhengxian ; Liu, Hao ; Zhang, Dawei ; Han, Yashuai ; Yang, Xinyan ; Zheng, Xianfeng ; Qu, Jun

Sensors (Basel, Switzerland), 2023-02, Vol.23 (4), p.1828 [Periódico revisado por pares]

Switzerland: MDPI AG

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6
All-optical NOT and XOR logic gates using photonic crystal nano-resonator and based on an interference effect
All-optical NOT and XOR logic gates using photonic crystal nano-resonator and based on an interference effect
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All-optical NOT and XOR logic gates using photonic crystal nano-resonator and based on an interference effect

Mohebzadeh-Bahabady, Ahmad ; Olyaee, Saeed

IET optoelectronics, 2018-08, Vol.12 (4), p.191-195 [Periódico revisado por pares]

The Institution of Engineering and Technology

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7
A Novel White Light Interference Based AFM Head
A Novel White Light Interference Based AFM Head
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A Novel White Light Interference Based AFM Head

Yang, Wenjun ; Yang, Xiaojun ; Lu, Wenlong ; Yu, Nengguo ; Chen, Liangzhou ; Zhou, Liping ; Chang, Suping

Journal of lightwave technology, 2017-08, Vol.35 (16), p.3604-3610 [Periódico revisado por pares]

New York: IEEE

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8
Analysis method of microstructure surface topography based on wavelet filter
Analysis method of microstructure surface topography based on wavelet filter
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Analysis method of microstructure surface topography based on wavelet filter

Zhang, Shu ; Shi, Yushu ; Gao, Sitian ; Pi, Lei ; Li, Qi ; Li, Wei ; Zhu, Zhendong ; Li, Shi ; Huang, Lu ; Guo, Xin Capmany, Jose ; Hao, Yue ; Nakano, Yoshiaki ; Zhang, Chao ; Yoshikawa, Akihiko ; Luo, Yi ; Zhuang, Songlin ; Su, Yikai ; Xie, Chongjin ; Lu, Wei ; Yu, Shaohua

SPIE 2016

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9
Measurement of nanoscale displacements using a Mirau white-light interference microscope and an inclined flat surface
Measurement of nanoscale displacements using a Mirau white-light interference microscope and an inclined flat surface
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Measurement of nanoscale displacements using a Mirau white-light interference microscope and an inclined flat surface

Phan, Nhue Nguyen ; Le, Hai Hoang ; Duong, Dung Chi ; Ta, Duong Van

Optical engineering, 2019-06, Vol.58 (6), p.1 [Periódico revisado por pares]

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10
Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy
Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy
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Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy

Hu, Chi ; Liu, Xiaojun ; Yang, Wenjun ; Lu, Wenlong ; Yu, Nengguo ; Chang, Suping

Optics and lasers in engineering, 2018-01, Vol.100, p.71-76 [Periódico revisado por pares]

Elsevier Ltd

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