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1
Asynchronous Single Flux Quantum Logic Gates Using Self-Clocking
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Asynchronous Single Flux Quantum Logic Gates Using Self-Clocking

Yamanashi, Yuki ; Fujisawa, Taisei ; Li, Zongyuan ; Yoshikawa, Nobuyuki

IEEE transactions on applied superconductivity, 2023-08, Vol.33 (5), p.1-5 [Periódico revisado por pares]

New York: IEEE

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2
Transmission Line Effects of Long Gate-to-Gate Interconnections in Adiabatic Quantum-Flux-Parametron Logic Circuits
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Transmission Line Effects of Long Gate-to-Gate Interconnections in Adiabatic Quantum-Flux-Parametron Logic Circuits

Asai, Kazuhito ; Takeuchi, Naoki ; Suzuki, Hideo ; Yamanashi, Yuki ; Yoshikawa, Nobuyuki

IEEE transactions on applied superconductivity, 2022-10, Vol.32 (7), p.1-7 [Periódico revisado por pares]

New York: IEEE

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3
Systematic Control of Negative Transconductance in Organic Heterojunction Transistor for High‐Performance, Low‐Power Flexible Ternary Logic Circuits
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Systematic Control of Negative Transconductance in Organic Heterojunction Transistor for High‐Performance, Low‐Power Flexible Ternary Logic Circuits

Lee, Chungryeol ; Choi, Junhwan ; Park, Hongkeun ; Lee, Changhyeon ; Kim, Chang‐Hyun ; Yoo, Hocheon ; Im, Sung Gap

Small (Weinheim an der Bergstrasse, Germany), 2021-11, Vol.17 (46), p.e2103365-n/a [Periódico revisado por pares]

Germany: Wiley Subscription Services, Inc

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4
Antiambipolar Transistor with Double Negative Differential Transconductances for Organic Quaternary Logic Circuits
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Antiambipolar Transistor with Double Negative Differential Transconductances for Organic Quaternary Logic Circuits

Panigrahi, Debdatta ; Hayakawa, Ryoma ; Wakayama, Yutaka

Advanced functional materials, 2023-05, Vol.33 (20), p.n/a [Periódico revisado por pares]

Hoboken: Wiley Subscription Services, Inc

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5
Design and Demonstration of a Superconducting Field-Programmable Gate Array Using Adiabatic Quantum-Flux-Parametron Logic and Memory
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Design and Demonstration of a Superconducting Field-Programmable Gate Array Using Adiabatic Quantum-Flux-Parametron Logic and Memory

Takahashi, Daichi ; Takeuchi, Naoki ; Yamanashi, Yuki ; Yoshikawa, Nobuyuki

IEEE transactions on applied superconductivity, 2022-10, Vol.32 (7), p.1-7 [Periódico revisado por pares]

New York: IEEE

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6
Analysis and Stabilization of Signal Reflections in Gate-to-Gate Connections for AQFP Circuits
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Analysis and Stabilization of Signal Reflections in Gate-to-Gate Connections for AQFP Circuits

Johnston, Michael A. ; Ayala, Christopher L. ; Tanaka, Tomoyuki ; Yoshikawa, Nobuyuki

IEEE transactions on applied superconductivity, 2023-08, Vol.33 (5), p.1-5 [Periódico revisado por pares]

New York: IEEE

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7
DNA Logic Circuits for Cancer Theranostics
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DNA Logic Circuits for Cancer Theranostics

Chen, Jing ; Fu, Shengnan ; Zhang, Chunyi ; Liu, Huiyu ; Su, Xin

Small (Weinheim an der Bergstrasse, Germany), 2022-05, Vol.18 (20), p.e2108008-n/a [Periódico revisado por pares]

Germany: Wiley Subscription Services, Inc

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8
Design of Memristor-Based Combinational Logic Circuits
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Design of Memristor-Based Combinational Logic Circuits

Liu, Gongzhi ; Shen, Shuhang ; Jin, Peipei ; Wang, Guangyi ; Liang, Yan

Circuits, systems, and signal processing, 2021-12, Vol.40 (12), p.5825-5846 [Periódico revisado por pares]

New York: Springer US

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9
A universal method for designing low-power carbon nanotube FET-based multiple-valued logic circuits
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A universal method for designing low-power carbon nanotube FET-based multiple-valued logic circuits

Moaiyeri, Mohammad Hossein ; Mirzaee, Reza Faghih ; Doostaregan, Akbar ; Navi, Keivan ; Hashemipour, Omid

IET computers & digital techniques, 2013-07, Vol.7 (4), p.167-181 [Periódico revisado por pares]

Stevenage: The Institution of Engineering and Technology

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10
Demonstration of Single-Flux-Quantum 64-B Lookup Table With Cryo-CMOS Decoders for Reconfiguration
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Demonstration of Single-Flux-Quantum 64-B Lookup Table With Cryo-CMOS Decoders for Reconfiguration

Hironaka, Yuki ; Hosoya, Takuya ; Yamanashi, Yuki ; Yoshikawa, Nobuyuki

IEEE transactions on applied superconductivity, 2022-11, Vol.32 (8), p.1-5 [Periódico revisado por pares]

New York: IEEE

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