Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Model predictive control: Recent developments and future promiseMayne, David Q.Automatica (Oxford), 2014-12, Vol.50 (12), p.2967-2986 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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Material Type: Artigo
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Mechanical characterization of bulk Sylgard 184 for microfluidics and microengineeringJohnston, I D ; McCluskey, D K ; Tan, C K L ; Tracey, M CJournal of micromechanics and microengineering, 2014-03, Vol.24 (3), p.35017-7 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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3 |
Material Type: Artigo
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Visual Tracking: An Experimental SurveySmeulders, Arnold W. M. ; Chu, Dung M. ; Cucchiara, Rita ; Calderara, Simone ; Dehghan, Afshin ; Shah, MubarakIEEE transactions on pattern analysis and machine intelligence, 2014-07, Vol.36 (7), p.1442-1468 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Guided Image FilteringHe, Kaiming ; Sun, Jian ; Tang, XiaoouIEEE transactions on pattern analysis and machine intelligence, 2013-06, Vol.35 (6), p.1397-1409 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Automatic generation and detection of highly reliable fiducial markers under occlusionGarrido-Jurado, S. ; Muñoz-Salinas, R. ; Madrid-Cuevas, F.J. ; Marín-Jiménez, M.J.Pattern recognition, 2014-06, Vol.47 (6), p.2280-2292 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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6 |
Material Type: Artigo
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Wirtinger-based integral inequality: Application to time-delay systemsSeuret, A. ; Gouaisbaut, F.Automatica (Oxford), 2013-09, Vol.49 (9), p.2860-2866 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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7 |
Material Type: Artigo
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Ga2O3 Schottky Barrier Diodes Fabricated by Using Single-Crystal β―Ga2O3 (010) SubstratesSASAKI, Kohei ; HIGASHIWAKI, Masataka ; KURAMATA, Akito ; MASUI, Takekazu ; YAMAKOSHI, ShigenobuIEEE electron device letters, 2013-04, Vol.34 (4), p.493-495 [Periódico revisado por pares]New York, NY: Institute of Electrical and Electronics EngineersTexto completo disponível |
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Material Type: Artigo
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Classification in the Presence of Label Noise: A SurveyFrenay, Benoit ; Verleysen, MichelIEEE transaction on neural networks and learning systems, 2014-05, Vol.25 (5), p.845-869New York, NY: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Fast Feature Pyramids for Object DetectionDollar, Piotr ; Appel, Ron ; Belongie, Serge ; Perona, PietroIEEE transactions on pattern analysis and machine intelligence, 2014-08, Vol.36 (8), p.1532-1545 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Representational Learning with ELMs for Big DataLIYANAARACHCHI LEKAMALAGE CHAMARA KASUN ; HONGMING ZHOU ; GUANG-BIN HUANG ; CHI MAN VONGIEEE intelligent systems, 2013-11, Vol.28 (6), p.31-34 [Periódico revisado por pares]New York, NY: IEEE Computer SocietyTexto completo disponível |