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Refinado por: assunto: Engineering remover assunto: Systems remover assunto: Receivers remover assunto: Applied Sciences remover
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1
Novel Generic Bounds on the Sum Rate of MIMO ZF Receivers
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Novel Generic Bounds on the Sum Rate of MIMO ZF Receivers

Matthaiou, M. ; Caijun Zhong ; Ratnarajah, T.

IEEE transactions on signal processing, 2011-09, Vol.59 (9), p.4341-4353 [Periódico revisado por pares]

New York, NY: IEEE

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2
On the Sum Rate of MIMO Nakagami-m Fading Channels with Linear Receivers
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On the Sum Rate of MIMO Nakagami-m Fading Channels with Linear Receivers

Caijun Zhong ; Matthaiou, M. ; Aiping Huang ; Zhaoyang Zhang

IEEE transactions on wireless communications, 2012-10, Vol.11 (10), p.3651-3659 [Periódico revisado por pares]

New York, NY: IEEE

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3
On the Maximal Diversity Order of Spatial Multiplexing With Transmit Antenna Selection
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On the Maximal Diversity Order of Spatial Multiplexing With Transmit Antenna Selection

Jalden, J. ; Ottersten, B.

IEEE transactions on information theory, 2007-11, Vol.53 (11), p.4273-4276 [Periódico revisado por pares]

New York, NY: IEEE

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4
Modeling of wide-band MIMO radio channels based on NLoS indoor measurements
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Modeling of wide-band MIMO radio channels based on NLoS indoor measurements

Kai Yu ; Bengtsson, M. ; Ottersten, B. ; McNamara, D. ; Karlsson, P. ; Beach, M.

IEEE transactions on vehicular technology, 2004-05, Vol.53 (3), p.655-665 [Periódico revisado por pares]

New York, NY: IEEE

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5
Code-Aided Maximum-Likelihood Ambiguity Resolution Through Free-Energy Minimization
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Code-Aided Maximum-Likelihood Ambiguity Resolution Through Free-Energy Minimization

Herzet, Cédric ; Woradit, Kampol ; Wymeersch, Henk ; Vandendorpe, Luc

IEEE transactions on signal processing, 2010-12, Vol.58 (12), p.6238-6250 [Periódico revisado por pares]

New York, NY: IEEE

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6
The Diversity Order of the Semidefinite Relaxation Detector
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The Diversity Order of the Semidefinite Relaxation Detector

Jalden, J. ; Ottersten, B.

IEEE transactions on information theory, 2008-04, Vol.54 (4), p.1406-1422 [Periódico revisado por pares]

New York, NY: IEEE

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