Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnosticValdivia, M. P. ; Stutman, D. ; Stoeckl, C. ; Theobald, W. ; Collins, G. W. ; Bouffetier, V. ; Vescovi, M. ; Mileham, C. ; Begishev, I. A. ; Klein, S. R. ; Melean, R. ; Muller, S. ; Zou, J. ; Veloso, F. ; Casner, A. ; Beg, F. N. ; Regan, S. P.Review of Scientific Instruments, 2021, Vol.92 (6) [Periódico revisado por pares]United StatesTexto completo disponível |
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2 |
Material Type: Ata de Congresso
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Low-Frequency-Noise-Based Oxide Trap Profiling in Replacement High-k/Metal-Gate pMOSFETsSimoen, Eddy Roger ; Lee, Jae-Woo ; Veloso, Anabela ; Paraschiv, Vasile ; Horiguchi, Naoto ; Claeys, CorECS transactions, 2013, Vol.58 (9), p.281-292The Electrochemical Society, IncTexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Au Nanoparticle-based Detection of Human Chorionic Gonadotropin Using Electrochemical Impedance SpectroscopyLi, Nan ; Li, Qi ; Chen, Xavier Ran ; Veloso, Anthony J. ; Hung, Vinci Wing Sze ; Dhar, Devjani ; Kerman, KaganECS transactions, 2013, Vol.50 (28), p.15-21The Electrochemical Society, IncTexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Development of large size photon detectors based on THGEM and hybrid MPGD architecturesTessarotto, F. ; Dasgupta, S. ; Denisov, O. ; Duic, V. ; Finger, M. ; Finger, M. ; Fischer, H. ; Giorgi, M. ; Gobbo, B. ; Gregori, M. ; Herrmann, F. ; Alexeev, M. ; Konigsmann, K. ; Levorato, S. ; Maggiora, A. ; Martin, A. ; Menon, G. ; Novakova, K. ; Novy, J. ; Panzieri, D. ; Pereira, F. A. ; Santos, C. A. ; Birsa, R. ; Sbrizzai, G. ; Schiavon, P. ; Schopferer, S. ; Slunecka, M. ; Sozzi, F. ; Steiger, L. ; Sulc, M. ; Takekawa, S. ; Veloso, J. F. C. A. ; Bradamante, F. ; Bressan, A. ; Buchelel, M. ; Chiosso, M. ; Ciliberti, P. ; Dalla Torre, S.2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC), 2013, p.1-8IEEETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Performance Evaluation of MQTT Brokers in the Internet of Things for Smart Citiesde Oliveira, Davi L. ; da S. Veloso, Artur F. ; Sobral, Jose V. V. ; Rabelo, Ricardo A. L. ; Rodrigues, Joel J. P. C. ; Solic, Petar2019 4th International Conference on Smart and Sustainable Technologies (SpliTech), 2019, p.1-6University of Split, FESBTexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Process control & integration options of RMG technology for aggressively scaled devicesVeloso, A. ; Higuchi, Y. ; Chew, S. A. ; Devriendt, K. ; Ragnarsson, L. ; Sebaai, F. ; Schram, T. ; Brus, S. ; Vecchio, E. ; Kellens, K. ; Rohr, E. ; Eneman, G. ; Simoen, E. ; Cho, M. J. ; Paraschiv, V. ; Crabbe, Y. ; Shi, X. ; Tielens, H. ; Van Ammel, A. ; Dekkers, H. ; Favia, P. ; Geypen, J. ; Bender, H. ; Phatak, A. ; del Agua Borniquel, J. ; Xu, K. ; Allen, M. ; Liu, C. ; Xu, T. ; Yoo, W. S. ; Thean, A. ; Horiguchi, N.2012 Symposium on VLSI Technology (VLSIT), 2012, p.33-34IEEETexto completo disponível |
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7 |
Material Type: Ata de Congresso
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An IoT Smart Metering Solution Based on IEEE 802.15.4da S. Veloso, Artur F. ; Rodrigues, Antonio A. ; Sobral, Jose V. V. ; Rodrigues, Joel J. P. C. ; Feitosa, Mateus S. S. ; Rabelo, Ricardo A. L.2018 IEEE Global Communications Conference (GLOBECOM), 2018, p.1-6IEEETexto completo disponível |
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8 |
Material Type: Ata de Congresso
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Gate-last vs. gate-first technology for aggressively scaled EOT logic/RF CMOSVeloso, A. ; Ragnarsson, L.-A ; Cho, M. J. ; Devriendt, K. ; Kellens, K. ; Sebaai, F. ; Suhard, S. ; Brus, S. ; Crabbe, Y. ; Schram, T. ; Rohr, E. ; Paraschiv, V. ; Eneman, G. ; Kauerauf, T. ; Dehan, M. ; Hong, S.-H ; Yamaguchi, S. ; Takeoka, S. ; Higuchi, Y. ; Tielens, H. ; Van Ammel, A. ; Favia, P. ; Bender, H. ; Franquet, A. ; Conard, T. ; Li, X. ; Pey, K.-L ; Struyf, H. ; Mertens, P. ; Absil, P. P. ; Horiguchi, N. ; Hoffmann, T.2011 Symposium on VLSI Technology - Digest of Technical Papers, 2011, p.34-35IEEETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Highly scalable effective work function engineering approach for multi-VT modulation of planar and FinFET-based RMG high-k last devices for (Sub-)22nm nodesVeloso, A. ; Boccardi, G. ; Ragnarsson, L.-A ; Higuchi, Y. ; Lee, J. W. ; Simoen, E. ; Roussel, Ph J. ; Cho, M. J. ; Chew, S. A. ; Schram, T. ; Dekkers, H. ; Van Ammel, A. ; Witters, T. ; Brus, S. ; Dangol, A. ; Paraschiv, V. ; Vecchio, E. ; Shi, X. ; Sebaai, F. ; Kellens, K. ; Heylen, N. ; Devriendt, K. ; Richard, O. ; Bender, H. ; Chiarella, T. ; Arimura, H. ; Thean, A. ; Horiguchi, N.2013 Symposium on VLSI Technology, 2013, p.T194-T195IEEETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Ion back flow reduction in a THGEM based detectorAlexeev, M. ; Dasgupta, S. S. ; Denisov, O. ; Duic, V. ; Finger, M. ; Finger, M. ; Fischer, H. ; Giorgi, M. ; Gobbo, B. ; Gregori, M. ; Hermann, F. ; Azevedo, C. D. R. ; Konigsmann, K. ; Levorato, S. ; Lopes, T. ; Maggiora, A. ; Martin, A. ; Menon, G. ; Nerling, F. ; Novakova, K. ; Novy, J. ; Panzieri, D. ; Birsa, R. ; Pereira, F. A. ; Liu, Q. ; Santos, C. A. ; Sbrizzai, G. ; Schiavon, P. ; Schill, C. ; Schopferer, S. ; Slunecka, M. ; Sozzi, F. ; Steiger, L. ; Bradamante, F. ; Sulc, M. ; Takekawa, S. ; Tessarotto, F. ; Veloso, J. F. C. A. ; Bressan, A. ; Chiosso, M. ; Ciliberti, P. ; Correia, P. M. M. ; Dalla Torre, S.2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC), 2012, p.1165-1171IEEETexto completo disponível |