Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Reliable modeling of ultrathin alternative plasmonic materials using spectroscopic ellipsometry [Invited]Secondo, R. ; Fomra, D. ; Izyumskaya, N. ; Avrutin, V. ; Hilfiker, J. N ; Martin, A. ; Özgür, Ü. ; Kinsey, N.Optical materials express, 2019-02, Vol.9 (2), p.760 [Periódico revisado por pares]Washington: Optical Society of AmericaTexto completo disponível |
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2 |
Material Type: Artigo
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Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength rangeKhoshman, J.M. ; Hilfiker, J.N. ; Tabet, N. ; Kordesch, M.E.Applied surface science, 2014-07, Vol.307, p.558-565 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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3 |
Material Type: Artigo
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Polarization resolved reflection from ordered vertical silicon nanowire arraysKhorasaninejad, M ; Abedzadeh, N ; Sun, J ; Hilfiker, J N ; Saini, S SOptics letters, 2012-07, Vol.37 (14), p.2961-2963 [Periódico revisado por pares]United StatesSem texto completo |
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4 |
Material Type: Artigo
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Quantum Composites with Charge‐Density‐Wave FillersBarani, Zahra ; Geremew, Tekwam ; Stokey, Megan ; Sesing, Nicholas ; Taheri, Maedeh ; Hilfiker, Matthew J. ; Kargar, Fariborz ; Schubert, Mathias ; Salguero, Tina T. ; Balandin, Alexander A.Advanced materials (Weinheim), 2023-05, Vol.35 (19), p.e2209708-n/a [Periódico revisado por pares]Germany: Wiley Subscription Services, IncTexto completo disponível |
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5 |
Material Type: Artigo
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Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cellsSAENGER, M. F ; SUN, J ; SCHÄDEL, M ; HILFIKER, J ; SCHUBERT, M ; WOOLLAM, J. AThin solid films, 2010-01, Vol.518 (7), p.1830-1834 [Periódico revisado por pares]Amsterdam: ElsevierTexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Optical Constants Determination of Pseudomorphic Si1-XGex Layers on Si(001), with 0<x<0.54Nolot, Emmanuel ; Hartmann, Jean-Michel ; Hilfiker, J.ECS transactions, 2014, Vol.64 (6), p.455-465The Electrochemical Society, IncTexto completo disponível |
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7 |
Material Type: Artigo
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Vacuum ultra-violet spectroscopic ellipsometry study of single- and multi-phase nitride protective filmsAouadi, S M ; Bohnhoff, A ; Amriou, T ; Williams, M ; Hilfiker, J N ; Singh, N ; Woollam, J AJournal of physics. Condensed matter, 2006-08, Vol.18 (32), p.S1691-S1701 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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8 |
Material Type: Artigo
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Physical and chemical properties of sputter-deposited TaCxNy filmsAouadi, S M ; Zhang, Y ; Basnyat, P ; Stadler, S ; Filip, P ; Williams, M ; Hilfiker, J N ; Singh, N ; Woollam, J AJournal of physics. Condensed matter, 2006-02, Vol.18 (6), p.1977-1986 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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9 |
Material Type: Artigo
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Ellipsometry characterization of bulk acoustic wave filtersNolot, E. ; Lefevre, A. ; Hilfiker, J. N.Physica status solidi. C, 2008-05, Vol.5 (5), p.1168-1171 [Periódico revisado por pares]Berlin: WILEY-VCH VerlagTexto completo disponível |
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10 |
Material Type: Artigo
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Optical properties of bulk and thin-film SrTiO3 on Si and PtZollner, Stefan ; Demkov, A. A. ; Liu, R. ; Fejes, P. L. ; Gregory, R. B. ; Alluri, Prasad ; Curless, J. A. ; Yu, Z. ; Ramdani, J. ; Droopad, R. ; Tiwald, T. E. ; Hilfiker, J. N. ; Woollam, J. A.Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2000-07, Vol.18 (4), p.2242-2254 [Periódico revisado por pares]Sem texto completo |