Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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An instrument for in situ time-resolved X-ray imaging and diffraction of laser powder bed fusion additive manufacturing processesCalta, Nicholas P. ; Wang, Jenny ; Kiss, Andrew M. ; Martin, Aiden A. ; Depond, Philip J. ; Guss, Gabriel M. ; Thampy, Vivek ; Fong, Anthony Y. ; Weker, Johanna Nelson ; Stone, Kevin H. ; Tassone, Christopher J. ; Kramer, Matthew J. ; Toney, Michael F. ; Van Buuren, Anthony ; Matthews, Manyalibo J.Review of scientific instruments, 2018-05, Vol.89 (5), p.055101-055101 [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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2 |
Material Type: Artigo
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New dynamic diamond anvil cells for tera-pascal per second fast compression x-ray diffraction experimentsJenei, Zs ; Liermann, H. P. ; Husband, R. ; Méndez, A. S. J. ; Pennicard, D. ; Marquardt, H. ; O’Bannon, E. F. ; Pakhomova, A. ; Konopkova, Z. ; Glazyrin, K. ; Wendt, M. ; Wenz, S. ; McBride, E. E. ; Morgenroth, W. ; Winkler, B. ; Rothkirch, A. ; Hanfland, M. ; Evans, W. J.Review of scientific instruments, 2019-06, Vol.90 (6) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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3 |
Material Type: Artigo
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Single-shot measurements of pulse-front tilt in intense ps laser pulses and its effect on accelerated electron and ion beam characteristics (invited)Grace, E. S. ; Djordjevic, B. Z. ; Guang, Z. ; Mariscal, D. ; Scott, G. G. ; Simpson, R. A. ; Swanson, K. K. ; Zeraouli, G. ; Stuart, B. ; Trebino, R. ; Ma, T.Review of scientific instruments, 2022-12, Vol.93 (12) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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4 |
Material Type: Artigo
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The multi-spectral imaging diagnosticLinehan, B. L. ; Mumgaard, R. T. ; Wensing, M. ; Verhaegh, K. ; Andrebe, Y. ; Harrison, J. R. ; Duval, B. P. ; Theiler, C.Review of scientific instruments, 2018-10, Vol.89 (10) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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5 |
Material Type: Artigo
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Continuous-wave planar laser induced fluorescence with a fast cameraPaul, M. C. ; Scime, E. E.Review of scientific instruments, 2021-04, Vol.92 (4) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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6 |
Material Type: Artigo
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Characterization of photodetector temporal response for neutron time-of-flight (nToF) diagnostics at the National Ignition FacilityGordon, J. M. ; Schlossberg, D. J. ; Eckart, M. J. ; Datte, P. S. ; Durand, C. E. ; Grim, G. P. ; Hartouni, E. P. ; Hatarik, R. ; Moore, A. S.Review of scientific instruments, 2018-10, Vol.89 (10) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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7 |
Material Type: Artigo
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Correlation polarimetry for broadband magnetic fluctuation measurementsParke, E. ; Ding, W. X. ; Brower, D. L.Review of scientific instruments, 2018-09, Vol.89 (10) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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8 |
Material Type: Artigo
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Application of motional Stark effect in situ background correction to a superconducting tokamakKo, Jinseok ; Scott, Steve ; Levinton, Fred ; Galante, Matthew ; Sabbagh, Steve ; Hahn, Sang-hee ; Jeon, YoungMuReview of scientific instruments, 2021-03, Vol.92 (3) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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9 |
Material Type: Artigo
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Extracting the turbulent flow-field from beam emission spectroscopy images using velocimetryKriete, D. M. ; McKee, G. R. ; Fonck, R. J. ; Smith, D. R. ; Whelan, G. G. ; Yan, Z.Review of scientific instruments, 2018-09, Vol.89 (10) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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10 |
Material Type: Artigo
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A heterodyne dispersion interferometer for wide bandwidth density measurements on DIII-DAkiyama, T. ; Van Zeeland, M. A. ; Boivin, R. L. ; Carlstrom, T. N. ; Chavez, J. A. ; Muscatello, C. M. ; O’Neill, R. ; Vasquez, J. ; Watkins, M. ; Martin, W. ; Colio, A. ; Finkenthal, D. K. ; Brower, D. L. ; Chen, J. ; Ding, W. X. ; Perry, M.Review of scientific instruments, 2018-07, Vol.89 (10) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |