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Refinado por: assunto: Surface Reconstruction remover
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Uncertainty-guided intelligent sampling strategy for high-efficiency surface measurement via free-knot B-spline regression modelling
Uncertainty-guided intelligent sampling strategy for high-efficiency surface measurement via free-knot B-spline regression modelling
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Uncertainty-guided intelligent sampling strategy for high-efficiency surface measurement via free-knot B-spline regression modelling

Lu, Wenlong ; Pagani, Luca ; Zhou, Liping ; Liu, Xiaojun ; Wang, Jian ; Leach, Richard ; Jiang, Xiangqian (Jane)

Precision engineering, 2019-03, Vol.56, p.38-52 [Periódico revisado por pares]

Elsevier Inc

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A Machine Vision Based In-Line Quality Assessment Method for the Fabrication of Structured Surfaces
A Machine Vision Based In-Line Quality Assessment Method for the Fabrication of Structured Surfaces
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A Machine Vision Based In-Line Quality Assessment Method for the Fabrication of Structured Surfaces

Wang, Maomao ; Zhong, Wenbin ; Yu, Guoyu ; Jiang, Xiangqian ; Zeng, Wenhan

2023 28th International Conference on Automation and Computing (ICAC), 2023, p.1-6

IEEE

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3
BRAS: Bidirectional reflectance adjustment strategy for 3D reconstruction of mirror-like surface
BRAS: Bidirectional reflectance adjustment strategy for 3D reconstruction of mirror-like surface
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BRAS: Bidirectional reflectance adjustment strategy for 3D reconstruction of mirror-like surface

Sun, Zheng ; Wang, Ben ; Zheng, Yabing ; Duan, Minghui ; Fan, Xin ; Jin, Yi ; Zheng, Jinjin

IEEE transactions on industrial informatics, 2023-02, p.1-10

IEEE

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4
DYnet++: A deep learning based single-shot phase-measuring deflectometry for the 3D measurement of complex free-form surfaces
DYnet++: A deep learning based single-shot phase-measuring deflectometry for the 3D measurement of complex free-form surfaces
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DYnet++: A deep learning based single-shot phase-measuring deflectometry for the 3D measurement of complex free-form surfaces

Nguyen, Manh The ; Ghim, Young-Sik ; Rhee, Hyug-Gyo

IEEE transactions on industrial electronics (1982), 2023-03, p.1-10 [Periódico revisado por pares]

IEEE

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An Exposure Fusion-Based Structured Light Approach for the 3D Measurement of a Specular Surface
An Exposure Fusion-Based Structured Light Approach for the 3D Measurement of a Specular Surface
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An Exposure Fusion-Based Structured Light Approach for the 3D Measurement of a Specular Surface

Wu, Ke ; Tan, Jie ; Xia, Hai Lun ; Liu, Cheng Bao

IEEE sensors journal, 2021-03, Vol.21 (5), p.6314-6324 [Periódico revisado por pares]

New York: IEEE

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6
Large Scale Multi-view Stereopsis Evaluation
Large Scale Multi-view Stereopsis Evaluation
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Large Scale Multi-view Stereopsis Evaluation

Jensen, Rasmus ; Dahl, Anders ; Vogiatzis, George ; Tola, Engil ; Aanaes, Henrik

2014 IEEE Conference on Computer Vision and Pattern Recognition, 2014, p.406-413

IEEE

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7
Accurate 3D Reconstruction of Dynamic Objects by Spatial-Temporal Multiplexing and Motion-Induced Error Elimination
Accurate 3D Reconstruction of Dynamic Objects by Spatial-Temporal Multiplexing and Motion-Induced Error Elimination
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Accurate 3D Reconstruction of Dynamic Objects by Spatial-Temporal Multiplexing and Motion-Induced Error Elimination

Sui, Congying ; He, Kejing ; Lyu, Congyi ; Liu, Yun-Hui

IEEE transactions on image processing, 2022, Vol.31, p.2106-2121 [Periódico revisado por pares]

United States: IEEE

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8
Active Stereo 3-D Surface Reconstruction Using Multistep Matching
Active Stereo 3-D Surface Reconstruction Using Multistep Matching
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Active Stereo 3-D Surface Reconstruction Using Multistep Matching

Sui, Congying ; He, Kejing ; Lyu, Congyi ; Wang, Zerui ; Liu, Yun-Hui

IEEE transactions on automation science and engineering, 2020-10, Vol.17 (4), p.2130-2144

IEEE

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9
A Structured Light Approach for 3-D Surface Reconstruction With a Stereo Line-Scan System
A Structured Light Approach for 3-D Surface Reconstruction With a Stereo Line-Scan System
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A Structured Light Approach for 3-D Surface Reconstruction With a Stereo Line-Scan System

Lilienblum, Erik ; Al-Hamadi, Ayoub

IEEE transactions on instrumentation and measurement, 2015-05, Vol.64 (5), p.1258-1266 [Periódico revisado por pares]

IEEE

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10
Pattern Encoding of Robust M-Array Driven by Texture Constraints
Pattern Encoding of Robust M-Array Driven by Texture Constraints
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Pattern Encoding of Robust M-Array Driven by Texture Constraints

Zhou, Xiao ; Zhou, Cong ; Kang, Yu ; Zhang, Tingting ; Mou, Xingang

IEEE transactions on instrumentation and measurement, 2023-01, Vol.72, p.1-1 [Periódico revisado por pares]

IEEE

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