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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Ata de Congresso
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A Logic for Locally Complete Abstract InterpretationsBruni, Roberto ; Giacobazzi, Roberto ; Gori, Roberta ; Ranzato, Francesco2021 36th Annual ACM/IEEE Symposium on Logic in Computer Science (LICS), 2021, p.1-13IEEESem texto completo |
| 2 |
Material Type: Ata de Congresso
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Identifying and Characterizing Silently-Evolved Methods in the Android APILiu, Pei ; Li, Li ; Yan, Yichun ; Fazzini, Mattia ; Grundy, John2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2021, p.308-317IEEETexto completo disponível |
| 3 |
Material Type: Ata de Congresso
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Unveiling the Mystery of API Evolution in Deep Learning Frameworks: A Case Study of Tensorflow 2Zhang, Zejun ; Yang, Yanming ; Xia, Xin ; Lo, David ; Ren, Xiaoxue ; Grundy, John2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2021, p.238-247IEEETexto completo disponível |
| 4 |
Material Type: Ata de Congresso
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Bugs.jar: A Large-Scale, Diverse Dataset of Real-World Java BugsSaha, Ripon ; Lyu, Yingjun ; Lam, Wing ; Yoshida, Hiroaki ; Prasad, Mukul2018 IEEE/ACM 15th International Conference on Mining Software Repositories (MSR), 2018, p.10-13ACMTexto completo disponível |
| 5 |
Material Type: Ata de Congresso
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Industry-Scale IR-Based Bug Localization: A Perspective from FacebookMurali, Vijayaraghavan ; Gross, Lee ; Qian, Rebecca ; Chandra, Satish2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2021, p.188-197IEEETexto completo disponível |
| 6 |
Material Type: Ata de Congresso
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DIRECTDEBUG: Automated Testing and Debugging of Feature ModelsLe, Viet-Man ; Felfernig, Alexander ; Uta, Mathias ; Benavides, David ; Galindo, Jose ; Tran, Thi Ngoc Trang2021 IEEE/ACM 43rd International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER), 2021, p.81-85IEEETexto completo disponível |
| 7 |
Material Type: Ata de Congresso
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Bridging the Gap Between Clone-and-Own and Software Product LinesKehrer, Timo ; Thum, Thomas ; SchultheiB, Alexander ; Bittner, Paul Maximilian2021 IEEE/ACM 43rd International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER), 2021, p.21-25IEEETexto completo disponível |
| 8 |
Material Type: Ata de Congresso
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D2A: A Dataset Built for AI-Based Vulnerability Detection Methods Using Differential AnalysisZheng, Yunhui ; Pujar, Saurabh ; Lewis, Burn ; Buratti, Luca ; Epstein, Edward ; Yang, Bo ; Laredo, Jim ; Morari, Alessandro ; Su, Zhong2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2021, p.111-120IEEETexto completo disponível |
| 9 |
Material Type: Ata de Congresso
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Semi-Automated Test-Case Propagation in Fork EcosystemsMukelabai, Mukelabai ; Berger, Thorsten ; Borba, Paulo2021 IEEE/ACM 43rd International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER), 2021, p.46-50IEEETexto completo disponível |
| 10 |
Material Type: Ata de Congresso
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What It Would Take to Use Mutation Testing in Industry-A Study at FacebookBeller, Moritz ; Wong, Chu-Pan ; Bader, Johannes ; Scott, Andrew ; Machalica, Mateusz ; Chandra, Satish ; Meijer, Erik2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2021, p.268-277IEEETexto completo disponível |
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