skip to main content
Idioma:
Primo Advanced Search
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search prefilters
Busca Simples
Resultados 1 2 3 4 5 next page
Refinado por: Nome da Publicação: Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA
MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA
Material Type:
Artigo 		Adicionar ao Meu Espaço

MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA

Silva, T.F. ; Rodrigues, C.L. ; Mayer, M. ; Moro, M.V. ; Trindade, G.F. ; Aguirre, F.R. ; Added, N. ; Rizzutto, M.A. ; Tabacniks, M.H.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2016-03, Vol.371, p.86-89 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
2
External-RBS, PIXE and NRA analysis for ancient swords
External-RBS, PIXE and NRA analysis for ancient swords
Material Type:
Artigo 		Adicionar ao Meu Espaço

External-RBS, PIXE and NRA analysis for ancient swords

Santos, Hellen C. ; Added, Nemitala ; Silva, Tiago F. ; Rodrigues, C.L.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-02, Vol.345, p.42-47 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
3
External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art
External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art
Material Type:
Artigo 		Adicionar ao Meu Espaço

External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art

Rizzutto, M.A. ; Moro, M.V. ; Silva, T.F. ; Trindade, G.F. ; Added, N. ; Tabacniks, M.H. ; Kajiya, E.M. ; Campos, P.H.V. ; Magalhães, A.G. ; Barbosa, M.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2014-08, Vol.332, p.411-414 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
4
Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel
Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel
Material Type:
Artigo 		Adicionar ao Meu Espaço

Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel

Paúl, A. ; Elmrabet, S. ; Alves, L.C. ; da Silva, M.F. ; Soares, J.C. ; Odriozola, J.A.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2001-07, Vol.181 (1), p.394-398 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
5
Ion beam and photoluminescence studies of Er and O implanted GaN
Ion beam and photoluminescence studies of Er and O implanted GaN
Material Type:
Artigo 		Adicionar ao Meu Espaço

Ion beam and photoluminescence studies of Er and O implanted GaN

Alves, E. ; da Silva, M.F. ; Soares, J.C. ; Vianden, R. ; Bartels, J. ; Kozanecki, A.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1999, Vol.147 (1), p.383-387 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
6
Oxide scale depth profiling of lanthanum-deposited AISI-304: An ion beam analysis
Oxide scale depth profiling of lanthanum-deposited AISI-304: An ion beam analysis
Material Type:
Artigo 		Adicionar ao Meu Espaço

Oxide scale depth profiling of lanthanum-deposited AISI-304: An ion beam analysis

Ager, F.J. ; Respaldiza, M.A. ; Paúl, A. ; Odriozola, J.A. ; da Silva, M.F. ; Soares, J.C.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1998-03, Vol.136 (1-4), p.1045-1051 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
7
Computer simulation of backscattering spectra from paint
Computer simulation of backscattering spectra from paint
Material Type:
Artigo 		Adicionar ao Meu Espaço

Computer simulation of backscattering spectra from paint

Mayer, M. ; Silva, T.F.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2017-09, Vol.406, p.75-81 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
8
Analysis of the elements sputtered during the lanthanum implantation in stainless steels
Analysis of the elements sputtered during the lanthanum implantation in stainless steels
Material Type:
Artigo 		Adicionar ao Meu Espaço

Analysis of the elements sputtered during the lanthanum implantation in stainless steels

Ager, F.J ; Respaldiza, M.A ; Paúl, A ; Odriozola, J.A ; Lobato, J.M ; da Silva, M.F ; Redondo, L.M ; Soares, J.C

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1998-04, Vol.139 (1), p.344-349 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
9
Bias and synergy in the self-consistent approach of data analysis of ion beam techniques
Bias and synergy in the self-consistent approach of data analysis of ion beam techniques
Material Type:
Artigo 		Adicionar ao Meu Espaço

Bias and synergy in the self-consistent approach of data analysis of ion beam techniques

Silva, T.F. ; Rodrigues, C.L. ; Tabacniks, M.H. ; von Toussaint, U. ; Mayer, M.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2022-12, Vol.533, p.9-16 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
10
Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe
Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe
Material Type:
Artigo 		Adicionar ao Meu Espaço

Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe

Alves, L.C ; Breese, M.B.H ; Alves, E ; Paúl, A ; da Silva, M.R ; da Silva, M.F ; Soares, J.C

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2000-03, Vol.161-163, p.334-338 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.