Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Gate-bias stress in amorphous oxide semiconductors thin-film transistorsLopes, M E ; Gomes, H L ; Medeiros, M C. R ; Barquinha, P ; Pereira, L ; Fortunato, E ; Martins, R ; Ferreira, IApplied physics letters, 2009-08, Vol.95 (6), p.063502-063502-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
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2 |
Material Type: Artigo
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Threshold switching behavior generated by the in situ filaments formation in carbon matrix enriched by ultra-small zirconium oxide nanoparticlesAhmed, W. ; Jeidi, H. ; Chouiref, L. ; Gomes, H. L. ; Dahman, H. ; El Mir, L.Applied physics. A, Materials science & processing, 2023, Vol.129 (1), Article 60 [Periódico revisado por pares]Berlin/Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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3 |
Material Type: Artigo
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The molecular structure of the surface of water-ethanol mixturesKirschner, Johannes ; Gomes, Anderson H. A ; Marinho, Ricardo R. T ; Björneholm, Olle ; Ågren, Hans ; Carravetta, Vincenzo ; Ottosson, Niklas ; Brito, Arnaldo Naves de ; Bakker, Huib JPhysical chemistry chemical physics : PCCP, 2021-05, Vol.23 (19), p.11568-11578 [Periódico revisado por pares]England: Royal Society of ChemistryTexto completo disponível |
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4 |
Material Type: Artigo
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Dynamics of Threshold Voltage Shifts in Organic and Amorphous Silicon Field-Effect TransistorsMathijssen, S. G. J. ; Cölle, M. ; Gomes, H. ; Smits, E. C. P. ; de Boer, B. ; McCulloch, I. ; Bobbert, P. A. ; de Leeuw, D. M.Advanced materials (Weinheim), 2007-10, Vol.19 (19), p.2785-2789 [Periódico revisado por pares]Weinheim: WILEY-VCH VerlagTexto completo disponível |
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5 |
Material Type: Artigo
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The Coupling of Shape Dynamics to MatterGomes, HJournal of physics. Conference series, 2012-01, Vol.360 (1), p.12058-5 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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6 |
Material Type: Artigo
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Resistive switching of silicon-silver thin film devices in flexible substratesDias, C ; Leitao, D C ; Freire, C S R ; Gomes, H L ; Cardoso, S ; Ventura, JNanotechnology, 2020-03, Vol.31 (13), p.135702-135702 [Periódico revisado por pares]EnglandTexto completo disponível |
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7 |
Material Type: Artigo
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Production and characterization of carbon-vanadium nanocompositesJeidi, H. ; Ahmed, W. ; Najeh, I. ; Chouiref, L. ; Montes-Morán, M. A. ; Gomes, H. L. ; Mir, L. ElJournal of materials science. Materials in electronics, 2022-10, Vol.33 (29), p.22957-22970 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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8 |
Material Type: Artigo
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Some comparisons for damage detection on structures using genetic algorithms and modal sensitivity methodGomes, H.M. ; Silva, N.R.S.Applied mathematical modelling, 2008-11, Vol.32 (11), p.2216-2232 [Periódico revisado por pares]New York, NY: Elsevier IncTexto completo disponível |
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9 |
Material Type: Artigo
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Reliability analysis of laminated composite structures using finite elements and neural networksLopes, P.A.M. ; Gomes, H.M. ; Awruch, A.M.Composite structures, 2010-06, Vol.92 (7), p.1603-1613 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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10 |
Material Type: Artigo
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Carbon nanotube supported ruthenium catalysts for the treatment of high strength wastewater with aniline using wet air oxidationGarcia, J. ; Gomes, H.T. ; Serp, Ph ; Kalck, Ph ; Figueiredo, J.L. ; Faria, J.L.Carbon (New York), 2006-10, Vol.44 (12), p.2384-2391 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |