Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Photoluminescence of MBE grown wurtzite Be-doped GaNDewsnip, D J ; Andrianov, A V ; Harrison, I ; Orton, J W ; Lacklison, D E ; Ren, G B ; Hooper, S E ; Cheng, T S ; Foxon, C TSemiconductor science and technology, 1998-05, Vol.13 (5), p.500-504 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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2 |
Material Type: Artigo
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The electron mobility and compensation in n-type GaNOrton, J W ; Foxon, C TSemiconductor science and technology, 1998-03, Vol.13 (3), p.310-313 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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3 |
Material Type: Artigo
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Low-temperature luminescence study of GaN films grown by MBEAndrianov, A V ; Lacklison, D E ; Orton, J W ; Dewsnip, D J ; Hooper, S E ; Foxon, C TSemiconductor science and technology, 1996-03, Vol.11 (3), p.366-371 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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4 |
Material Type: Artigo
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Secondary ion mass spectroscopy investigations of magnesium and carbon doped gallium nitride films grown by molecular beam epitaxyBer, B Ya ; Kudriavtsev, Yu A ; Merkulov, A V ; Novikov, S V ; Lacklison, D E ; Orton, J W ; Cheng, T S ; Foxon, C TSemiconductor science and technology, 1998-01, Vol.13 (1), p.71-74 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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5 |
Material Type: Artigo
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Improvement of the photoluminescence from gallium nitride layers grown by MBE with an additional incident indium fluxFoxon, C T ; Hooper, S E ; Cheng, T S ; Orton, J W ; Ren, G B ; Ber, B Ya ; Merkulov, A V ; Novikov, S V ; Tret'yakov, V VSemiconductor science and technology, 1998-12, Vol.13 (12), p.1469-1471 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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6 |
Material Type: Artigo
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Observation of resonant Raman lines during the photoluminescence of doped GaNDewsnip, D J ; Andrianov, A V ; Harrison, I ; Lacklison, D E ; Orton, J W ; Morgan, J ; Ren, G B ; Cheng, T S ; Hooper, S E ; Foxon, C TSemiconductor science and technology, 1997-01, Vol.12 (1), p.55-58 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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7 |
Material Type: Artigo
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Secondary-ion mass spectroscopy (SIMS) investigations of Be and Si incorporation in GaN grown by molecular beam epitaxy (MBE)Cheng, T S ; Foxon, C T ; Jenkins, L C ; Hooper, S E ; Lacklison, D E ; Orton, J W ; Ber, B Ya ; Merkulov, A V ; Novikov, S VSemiconductor science and technology, 1996-04, Vol.11 (4), p.538-541 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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8 |
Material Type: Artigo
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Recombination lifetime measurements in AlGaAs/GaAs quantum well structuresOrton, J W ; Dawson, P ; Lacklison, D E ; Cheng, T S ; Foxon, C TSemiconductor science and technology, 1994-09, Vol.9 (9), p.1616-1622 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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9 |
Material Type: Artigo
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MBE growth and characterization of magnesium-doped gallium nitrideDewsnip, D J ; Orton, J W ; Lacklison, D E ; Flannery, L ; Andrianov, A V ; Harrison, I ; Hooper, S E ; Cheng, T S ; Foxon, C T ; Novikov, S N ; Ber, B Ya ; Kudriavtsev, Yu ASemiconductor science and technology, 1998-08, Vol.13 (8), p.927-935 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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10 |
Material Type: Artigo
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Photoluminescence from GaN films grown by MBE on an LiGaO2 substrateANDRIANOV, A. V ; LACKLISON, D. E ; ORTON, J. W ; CHENG, T. S ; FOXON, C. T ; O'DONNELL, K. P ; NICHOLLS, J. F. HSemiconductor science and technology, 1997, Vol.12 (1), p.59-63 [Periódico revisado por pares]Bristol: Institute of PhysicsTexto completo disponível |