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Dry etching performance of advanced EUV mask blanks
Material Type:
Ata de Congresso
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Dry etching performance of advanced EUV mask blanks

WHANG, John ; CHANDRACHOOD, Madhavi ; CHEN, Jeff ; BANQIU WU ; GALLAGHER, Emily ; FAURE, Tom ; GRIMBERGEN, Michael ; CRAWFORD, Shaun ; YU, Keven ; LEUNG, T. Y. B ; WISTROM, Richard ; SABHARWAL, Amitabh

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.8166

Bellingham Wash: SPIE

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2
A High-Density, High-Efficiency, Isolated On-Board Vehicle Battery Charger Utilizing Silicon Carbide Power Devices
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Artigo
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A High-Density, High-Efficiency, Isolated On-Board Vehicle Battery Charger Utilizing Silicon Carbide Power Devices

Whitaker, Bret ; Barkley, Adam ; Cole, Zach ; Passmore, Brandon ; Martin, Daniel ; McNutt, Ty R. ; Lostetter, Alexander B. ; Jae Seung Lee ; Shiozaki, Koji

IEEE transactions on power electronics, 2014-05, Vol.29 (5), p.2606-2617 [Periódico revisado por pares]

New York: IEEE

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3
Improvement of a Human-Machine Interface (HMI) for Driver Assistance Using an Event-Driven Prompting Display
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Artigo
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Improvement of a Human-Machine Interface (HMI) for Driver Assistance Using an Event-Driven Prompting Display

Ravani, B ; Gabibulayev, M ; Lasky, Ty A

IEEE transactions on control systems technology, 2011-05, Vol.19 (3), p.622-627 [Periódico revisado por pares]

New York, NY: IEEE

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4
Design and Implementation of a Mechatronic, All-Accelerometer Inertial Measurement Unit
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Artigo
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Design and Implementation of a Mechatronic, All-Accelerometer Inertial Measurement Unit

Parsa, K. ; Lasky, T.A. ; Ravani, B.

IEEE/ASME transactions on mechatronics, 2007-12, Vol.12 (6), p.640-650 [Periódico revisado por pares]

New York: IEEE

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5
A 4H Silicon Carbide Gate Buffer for Integrated Power Systems
Material Type:
Artigo
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A 4H Silicon Carbide Gate Buffer for Integrated Power Systems

Ericson, Nance ; Frank, Shane ; Britton, Chuck ; Marlino, Laura ; Sei-Hyung Ryu ; Grider, Dave ; Mantooth, Alan ; Francis, Matt ; Lamichhane, Ranjan ; Mudholkar, Mihir ; Shepherd, Paul ; Glover, Michael ; Valle-Mayorga, Javier ; McNutt, Ty ; Barkley, Adam ; Whitaker, Bret ; Cole, Zach ; Passmore, Brandon ; Lostetter, Alex

IEEE transactions on power electronics, 2014-02, Vol.29 (2), p.539-542 [Periódico revisado por pares]

New York, NY: IEEE

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6
How much does transmit correlation affect the sum-rate scaling of MIMO gaussian broadcast channels?
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Artigo
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How much does transmit correlation affect the sum-rate scaling of MIMO gaussian broadcast channels?

Al-Naffouri, T.Y. ; Sharif, M. ; Hassibi, B.

IEEE transactions on communications, 2009-02, Vol.57 (2), p.562-572 [Periódico revisado por pares]

New York, NY: IEEE

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7
Design of microstrip bandpass filters with multiorder spurious-mode suppression
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Artigo
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Design of microstrip bandpass filters with multiorder spurious-mode suppression

CHEN, Chi-Feng ; HUANG, Ting-Yi ; WU, Ruey-Beei

IEEE transactions on microwave theory and techniques, 2005-12, Vol.53 (12), p.3788-3793 [Periódico revisado por pares]

New York, NY: IEEE

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8
A UVLO Circuit in SiC Compatible With Power MOSFET Integration
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Artigo
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A UVLO Circuit in SiC Compatible With Power MOSFET Integration

Glover, Michael D. ; Shepherd, Paul ; Francis, A. Matt ; Mudholkar, Mihir ; Mantooth, Homer Alan ; Ericson, Milton Nance ; Frank, S. Shane ; Britton, Charles L. ; Marlino, Laura D. ; McNutt, Ty R. ; Barkley, Adam ; Whitaker, Bret ; Lostetter, Alexander B.

IEEE journal of emerging and selected topics in power electronics, 2014-09, Vol.2 (3), p.425-433 [Periódico revisado por pares]

Piscataway: IEEE

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9
Resonant clocking using distributed parasitic capacitance
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Artigo
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Resonant clocking using distributed parasitic capacitance

Drake, A.J. ; Nowka, K.J. ; Nguyen, T.Y. ; Burns, J.L. ; Brown, R.B.

IEEE journal of solid-state circuits, 2004-09, Vol.39 (9), p.1520-1528 [Periódico revisado por pares]

New York, NY: IEEE

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10
A 32-bit PowerPC system-on-a-chip with support for dynamic voltage scaling and dynamic frequency scaling
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Artigo
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A 32-bit PowerPC system-on-a-chip with support for dynamic voltage scaling and dynamic frequency scaling

Nowka, K.J. ; Carpenter, G.D. ; MacDonald, E.W. ; Ngo, H.C. ; Brock, B.C. ; Ishii, K.I. ; Nguyen, T.Y. ; Burns, J.L.

IEEE journal of solid-state circuits, 2002-11, Vol.37 (11), p.1441-1447 [Periódico revisado por pares]

New York: IEEE

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