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Atrial Fibrillation During an Exploration Class Mission
Atrial Fibrillation During an Exploration Class Mission
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Atrial Fibrillation During an Exploration Class Mission

Lipset, Mark A. ; Lemery, Jay ; Polk, J. D. ; Hamilton, Douglas R.

Johnson Space Center 2010

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2
Deadlock avoidance in manufacturing systems with a multiple resource request model
Deadlock avoidance in manufacturing systems with a multiple resource request model
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Deadlock avoidance in manufacturing systems with a multiple resource request model

Judd, R.P. ; Zhang, W. ; Lipset, R.

Proceedings of the 2002 American Control Conference (IEEE Cat. No.CH37301), 2002, Vol.6, p.4443-4448 vol.6

Piscataway NJ: IEEE

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3
Analytic modeling of the unreliable buffer in the serial transfer line
Analytic modeling of the unreliable buffer in the serial transfer line
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Analytic modeling of the unreliable buffer in the serial transfer line

Lipset, R. ; Sengupta, S. ; Van Til, R.P.

Proceedings of 26th Southeastern Symposium on System Theory, 1994, p.122-126

IEEE

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4
Necessary and sufficient conditions for deadlock in manufacturing systems
Necessary and sufficient conditions for deadlock in manufacturing systems
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Necessary and sufficient conditions for deadlock in manufacturing systems

Lipset, R. ; Deering, P.E. ; Judd, R.P.

Proceedings of the 1997 American Control Conference (Cat. No.97CH36041), 1997, Vol.2, p.1022-1026 vol.2

IEEE

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5
A stack-based algorithm for deadlock avoidance in flexible manufacturing systems
A stack-based algorithm for deadlock avoidance in flexible manufacturing systems
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A stack-based algorithm for deadlock avoidance in flexible manufacturing systems

Lipset, R. ; Deering, P.E. ; Judd, R.P.

Proceedings of the 1998 American Control Conference. ACC (IEEE Cat. No.98CH36207), 1998, Vol.2, p.1252-1256 vol.2

IEEE

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6
A scalable deadlock avoidance algorithm for flexible manufacturing systems with free choice in part routing
A scalable deadlock avoidance algorithm for flexible manufacturing systems with free choice in part routing
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A scalable deadlock avoidance algorithm for flexible manufacturing systems with free choice in part routing

Judd, R.P. ; Wenle Zhang ; Deering, P. ; Lipset, R.

Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334), 2000, Vol.5, p.3545-3549 vol.5

IEEE

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7
A decomposition technique for steady-state performance evaluation of serial transfer lines subject to machine and buffer failures
A decomposition technique for steady-state performance evaluation of serial transfer lines subject to machine and buffer failures
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A decomposition technique for steady-state performance evaluation of serial transfer lines subject to machine and buffer failures

Lipset, R. ; Sengupta, S. ; Van Til, R.P.

Proceedings of 1994 33rd IEEE Conference on Decision and Control, 1994, Vol.1, p.595-600 vol.1

IEEE

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8
Deadlock avoidance in manufacturing systems with non-deterministic part routings
Deadlock avoidance in manufacturing systems with non-deterministic part routings
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Deadlock avoidance in manufacturing systems with non-deterministic part routings

Lipset, R. ; Judd, R.P. ; Wenle Zhang

Proceedings of the 2001 American Control Conference. (Cat. No.01CH37148), 2001, Vol.6, p.4930-4936 vol.6

IEEE

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9
Classification of part movements for deadlock avoidance in manufacturing systems
Classification of part movements for deadlock avoidance in manufacturing systems
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Classification of part movements for deadlock avoidance in manufacturing systems

Lipset, R. ; Judd, R.P. ; Deering, P.E. ; Zhang, W. ; Caw, J.

Proceedings of the 1999 American Control Conference (Cat. No. 99CH36251), 1999, Vol.3, p.1971-1975 vol.3

IEEE

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10
Derivation of repair and processing rates for decomposition of serial transfer lines with unreliable buffers
Derivation of repair and processing rates for decomposition of serial transfer lines with unreliable buffers
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Derivation of repair and processing rates for decomposition of serial transfer lines with unreliable buffers

Lipset, R. ; Van Til, R.P. ; Sengupta, S.

Proceedings of 1995 American Control Conference - ACC'95, 1995, Vol.3, p.2168-2169 vol.3

IEEE

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