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The Influence of the Epitaxial Growth Process Parameters on Layer Characteristics and Device Performance in Si-Passivated Ge pMOSFETs
The Influence of the Epitaxial Growth Process Parameters on Layer Characteristics and Device Performance in Si-Passivated Ge pMOSFETs
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The Influence of the Epitaxial Growth Process Parameters on Layer Characteristics and Device Performance in Si-Passivated Ge pMOSFETs

Caymax, Matty ; Leys, Frederik ; Mitard, Jéro^me ; Martens, Koen ; Yang, Lijun ; Pourtois, Geoffrey ; Vandervorst, Wilfried ; Meuris, Marc ; Loo, Roger

Journal of the Electrochemical Society, 2009, Vol.156 (12), p.H979 [Periódico revisado por pares]

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Quasi Two-Dimensional Si-O Superlattices: Atomically Controlled Growth and Electrical Properties
Quasi Two-Dimensional Si-O Superlattices: Atomically Controlled Growth and Electrical Properties
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Quasi Two-Dimensional Si-O Superlattices: Atomically Controlled Growth and Electrical Properties

Jayachandran, Suseendran ; Simoen, Eddy ; Martens, Koen ; Meersschaut, Johan ; Bender, Hugo ; Caymax, Matty ; Vandervorst, Wilfried ; Heyns, Marc ; Delabie, Annelies

ECS journal of solid state science and technology, 2016-01, Vol.5 (7), p.P396-P403 [Periódico revisado por pares]

The Electrochemical Society

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3
The Influence of the Epitaxial Growth Process Parameters on Layer Characteristics and Device Performance in Si-passivated Ge pMOSFETs
The Influence of the Epitaxial Growth Process Parameters on Layer Characteristics and Device Performance in Si-passivated Ge pMOSFETs
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The Influence of the Epitaxial Growth Process Parameters on Layer Characteristics and Device Performance in Si-passivated Ge pMOSFETs

Caymax, Matty R. ; Leys, Frederik ; Mitard, Jerome ; Martens, Koen ; Yang, Lijun ; Pourtois, Geoffrey ; Vandervorst, Wilfried ; Meuris, Marc ; Loo, Roger

ECS transactions, 2009, Vol.19 (1), p.183-194

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4
Characterization of COK-5, Member of a New Family of Zeolite Material with Multiple Channel Systems
Characterization of COK-5, Member of a New Family of Zeolite Material with Multiple Channel Systems
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Characterization of COK-5, Member of a New Family of Zeolite Material with Multiple Channel Systems

Kirschhock, Christine ; Bons, Anton-Jan ; Mertens, Machteld ; Ravishankar, Raman ; Mortier, Wilfried ; Jacobs, Pierre ; Martens, Johan

Chemistry of materials, 2005-11, Vol.17 (23), p.5618-5624 [Periódico revisado por pares]

American Chemical Society

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5
Spatially resolved generation profiles for building, land and water-bound PV: a case study of four Dutch energy transition scenarios
Spatially resolved generation profiles for building, land and water-bound PV: a case study of four Dutch energy transition scenarios
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Spatially resolved generation profiles for building, land and water-bound PV: a case study of four Dutch energy transition scenarios

Nortier, Nick ; Paardekooper, Michel ; Lucas, Chris ; Blankert, Anne ; van der Neut, Arendjan ; Luxembourg, Stefan ; Mewe, Agnes ; van Sark, Wilfried

Advances in geosciences, 2023-07, Vol.58, p.199-216 [Periódico revisado por pares]

Katlenburg-Lindau: Copernicus GmbH

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6
Source/Drain Materials for Ge nMOS Devices: Phosphorus Activation in Epitaxial Si, Ge, Ge1−xSnx and SiyGe1−x−ySnx
Source/Drain Materials for Ge nMOS Devices: Phosphorus Activation in Epitaxial Si, Ge, Ge1−xSnx and SiyGe1−x−ySnx
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Source/Drain Materials for Ge nMOS Devices: Phosphorus Activation in Epitaxial Si, Ge, Ge1−xSnx and SiyGe1−x−ySnx

Vohra, Anurag ; Makkonen, Ilja ; Pourtois, Geoffrey ; Slotte, Jonatan ; Porret, Clement ; Rosseel, Erik ; Khanam, Afrina ; Tirrito, Matteo ; Douhard, Bastien ; Loo, Roger ; Vandervorst, Wilfried

ECS journal of solid state science and technology, 2020-05, Vol.9 (4) [Periódico revisado por pares]

IOP Publishing

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7
Blending the Evaporation Precipitation Ratio With the Complementary Principle Function for the Prediction of Evaporation
Blending the Evaporation Precipitation Ratio With the Complementary Principle Function for the Prediction of Evaporation
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Blending the Evaporation Precipitation Ratio With the Complementary Principle Function for the Prediction of Evaporation

Zhang, Lu ; Brutsaert, Wilfried

Water resources research, 2021-07, Vol.57 (7), p.n/a [Periódico revisado por pares]

Washington: John Wiley & Sons, Inc

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8
Spatial Distribution of Global Landscape Evaporation in the Early Twenty-First Century by Means of a Generalized Complementary Approach
Spatial Distribution of Global Landscape Evaporation in the Early Twenty-First Century by Means of a Generalized Complementary Approach
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Spatial Distribution of Global Landscape Evaporation in the Early Twenty-First Century by Means of a Generalized Complementary Approach

Brutsaert, Wilfried ; Cheng, Lei ; Zhang, Lu

Journal of hydrometeorology, 2020-02, Vol.21 (2), p.287-298 [Periódico revisado por pares]

Boston: American Meteorological Society

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9
Impedance spectroscopy as a probe for the degradation of organic light-emitting diodes
Impedance spectroscopy as a probe for the degradation of organic light-emitting diodes
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Impedance spectroscopy as a probe for the degradation of organic light-emitting diodes

Nowy, Stefan ; Ren, Wei ; Elschner, Andreas ; Lövenich, Wilfried ; Brütting, Wolfgang

Journal of applied physics, 2010-03, Vol.107 (5) [Periódico revisado por pares]

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10
Relative sea level variations in the Chukchi region - Arctic Ocean - since the late Eocene
Relative sea level variations in the Chukchi region - Arctic Ocean - since the late Eocene
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Relative sea level variations in the Chukchi region - Arctic Ocean - since the late Eocene

Hegewald, Anne ; Jokat, Wilfried

Geophysical research letters, 2013-03, Vol.40 (5), p.803-807 [Periódico revisado por pares]

Washington: Blackwell Publishing Ltd

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