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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: Resolving the myth of apparent constant binding energy of the C 1s peakGreczynski, G. ; Hultman, L.Applied surface science, 2018-09, Vol.451, p.99-103 [Peer Reviewed Journal]Elsevier B.VFull text available |
| 2 |
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Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin filmsGreczynski, G. ; Hultman, L.Applied surface science, 2016-11, Vol.387, p.294-300 [Peer Reviewed Journal]Elsevier B.VFull text available |
| 3 |
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X-ray photoelectron spectroscopy studies of Ti1-xAlxN (0 ≤ x ≤ 0.83) high-temperature oxidation: The crucial role of Al concentrationGreczynski, G. ; Hultman, L. ; Odén, M.Surface & coatings technology, 2019-09, Vol.374, p.923-934 [Peer Reviewed Journal]Lausanne: Elsevier B.VFull text available |
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Core-level spectra and binding energies of transition metal nitrides by non-destructive x-ray photoelectron spectroscopy through capping layersGreczynski, G. ; Primetzhofer, D. ; Lu, J. ; Hultman, L.Applied surface science, 2017-02, Vol.396, p.347-358 [Peer Reviewed Journal]Elsevier B.VFull text available |
| 5 |
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A review of metal-ion-flux-controlled growth of metastable TiAlN by HIPIMS/DCMS co-sputteringGreczynski, G. ; Lu, J. ; Jensen, J. ; Bolz, S. ; Kölker, W. ; Schiffers, Ch ; Lemmer, O. ; Greene, J.E. ; Hultman, L.Surface & coatings technology, 2014-10, Vol.257, p.15-25 [Peer Reviewed Journal]Elsevier B.VFull text available |
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High Si content TiSiN films with superior oxidation resistanceGreczynski, G. ; Bakhit, B. ; Hultman, L. ; Odén, M.Surface & coatings technology, 2020-09, Vol.398, p.126087, Article 126087 [Peer Reviewed Journal]Lausanne: Elsevier B.VFull text available |
| 7 |
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Supertoughening in B1 transition metal nitride alloys by increased valence electron concentrationSangiovanni, D.G. ; Hultman, L. ; Chirita, V.Acta materialia, 2011-03, Vol.59 (5), p.2121-2134 [Peer Reviewed Journal]Elsevier LtdFull text available |
| 8 |
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Microstructural evolution during film growthPetrov, I. ; Barna, P. B. ; Hultman, L. ; Greene, J. E.Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2003-09, Vol.21 (5), p.S117-S128 [Peer Reviewed Journal]Full text available |
| 9 |
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Strain evolution during spinodal decomposition of TiAlN thin filmsRogström, L. ; Ullbrand, J. ; Almer, J. ; Hultman, L. ; Jansson, B. ; Odén, M.Thin solid films, 2012-06, Vol.520 (17), p.5542-5549 [Peer Reviewed Journal]Elsevier B.VFull text available |
| 10 |
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Mechanical properties and machining performance of Ti1-xAlxN-coated cutting toolsHÖRLING, A ; HULTMAN, L ; ODEN, M ; SJÖLEN, J ; KARLSSON, LSurface & coatings technology, 2005-02, Vol.191 (2-3), p.384-392 [Peer Reviewed Journal]Lausanne: ElsevierFull text available |
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