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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
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Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA

Luis A. C. Benites Fabio Benevenuti; Adria B de Oliveira; Fernanda L Kastensmidt; Nemitala Added; Vitor Ângelo Paulino de Aguiar; Nilberto Heder Nilberto H. Medina; Marcilei A Guazzelli

IEEE Transactions on Nuclear Science Piscataway, NJ v. 66 , n. 7, p. 1433-1440, 2019

Piscataway, NJ 2019

Acesso online

2
Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects

Ádria Oliveira Lucas A Tambara; Fabio Benevenuti; Luis A. C Benites; Nemitala Added; Vitor Aguiar; N. H Medina https://orcid.org/0000-0003-0650-6507; Marcilei Aparecida Guazzelli; Fernanda Kastensmidt

IEEE Transactions on Nuclear Science New Jersey: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2020 v. 67, n. 7, p. 1503-1510, julho, 2020

New Jersey 2020

Item não circula. Consulte sua biblioteca.(Acessar)

3
Investigation of electrically active defects in SiC power diodes caused by heavy ion irradiation
Investigation of electrically active defects in SiC power diodes caused by heavy ion irradiation
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Investigation of electrically active defects in SiC power diodes caused by heavy ion irradiation

Fur, N. ; Belanche, M. ; Martinella, C. ; Kumar, P. ; Bathen, M. E. ; Grossner, U.

IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1-1 [Periódico revisado por pares]

New York: IEEE

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4
Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation
Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation
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Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation

Roed, Ketil ; Eriksen, Dag Oistein ; Ceccaroli, Bruno ; Martinella, Corinna ; Javanainen, Arto ; Reshanov, Sergey ; Massetti, Silvia

IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1675-1682 [Periódico revisado por pares]

New York: IEEE

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5
TCAD Simulation of the Single Event Effects in Normally-OFF GaN Transistors After Heavy Ion Radiation
TCAD Simulation of the Single Event Effects in Normally-OFF GaN Transistors After Heavy Ion Radiation
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TCAD Simulation of the Single Event Effects in Normally-OFF GaN Transistors After Heavy Ion Radiation

Zerarka, M. ; Austin, P. ; Bensoussan, A. ; Morancho, F. ; Durier, A.

IEEE transactions on nuclear science, 2017-08, Vol.64 (8), p.2242-2249 [Periódico revisado por pares]

New York: IEEE

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6
Using Track Structure Theory to Predict Heavy-Ion Cross Sections From Neutron Data and Vice Versa
Using Track Structure Theory to Predict Heavy-Ion Cross Sections From Neutron Data and Vice Versa
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Using Track Structure Theory to Predict Heavy-Ion Cross Sections From Neutron Data and Vice Versa

Hansen, D. L. ; Resor, S. ; Vermeire, B. ; Czajkowski, D.

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.548-554 [Periódico revisado por pares]

New York: IEEE

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7
PIPS Diode Test Setup for Heavy Ion Beam Spectral Characterization
PIPS Diode Test Setup for Heavy Ion Beam Spectral Characterization
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PIPS Diode Test Setup for Heavy Ion Beam Spectral Characterization

Borel, Thomas ; Costantino, Alessandra ; Muschitiello, Michele ; Kettunen, Heikki ; Standaert, Laurent ; Santin, Giovanni ; Pinto, Marco ; Rizzo, Marta ; Pesce, Anastasia ; Ferlet-Cavrois, Veronique

IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1-1 [Periódico revisado por pares]

New York: IEEE

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8
An SEGR Hardened by Design Charge Pump for MTP Memories
An SEGR Hardened by Design Charge Pump for MTP Memories
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An SEGR Hardened by Design Charge Pump for MTP Memories

Ren, Pengxu ; Li, Jiancheng ; Li, Gang ; Jiang, Xiaoyun ; Xiao, Yu ; Tang, Minghua

IEEE transactions on nuclear science, 2024-05, Vol.71 (5), p.1218-1224 [Periódico revisado por pares]

New York: IEEE

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9
Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs
Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs
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Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs

Martinella, C. ; Ziemann, T. ; Stark, R. ; Tsibizov, A. ; Voss, K. O. ; Alia, R. G. ; Kadi, Y. ; Grossner, U. ; Javanainen, A.

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1381-1389, Article 1381 [Periódico revisado por pares]

New York: IEEE

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10
Simulating Optical Single Event Transients on Silicon Photonic Waveguides for Satellite Communication
Simulating Optical Single Event Transients on Silicon Photonic Waveguides for Satellite Communication
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Simulating Optical Single Event Transients on Silicon Photonic Waveguides for Satellite Communication

Terrasanta, Giulio ; Ziarko, Marcin W. ; Bergamasco, Nicola ; Poot, Menno ; Poliak, Juraj

IEEE transactions on nuclear science, 2024-02, Vol.71 (2), p.176-183 [Periódico revisado por pares]

New York: IEEE

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