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Refinado por: data de publicação: 2009Até2011 remover
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1
Stress-relaxation behavior in gels with ionic and covalent crosslinks
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Stress-relaxation behavior in gels with ionic and covalent crosslinks

Zhao, Xuanhe ; Huebsch, Nathaniel ; Mooney, David J ; Suo, Zhigang

Journal of applied physics, 2010-03, Vol.107 (6), p.063509-063509-5 [Periódico revisado por pares]

United States: American Institute of Physics

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2
Microassembly based on hands free origami with bidirectional curvature
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Microassembly based on hands free origami with bidirectional curvature

Bassik, Noy ; Stern, George M ; Gracias, David H

Applied physics letters, 2009-08, Vol.95 (9), p.091901-091901-3 [Periódico revisado por pares]

United States: American Institute of Physics

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3
Monolithic diamond optics for single photon detection
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Monolithic diamond optics for single photon detection

Siyushev, P ; Kaiser, F ; Jacques, V ; Gerhardt, I ; Bischof, S ; Fedder, H ; Dodson, J ; Markham, M ; Twitchen, D ; Jelezko, F ; Wrachtrup, J

Applied physics letters, 2010-12, Vol.97 (24), p.241902-241902-3 [Periódico revisado por pares]

United States: American Institute of Physics

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4
CdTe quantum dots and polymer nanocomposites for x-ray scintillation and imaging
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CdTe quantum dots and polymer nanocomposites for x-ray scintillation and imaging

Kang, Zhitao ; Zhang, Yuelan ; Menkara, Hisham ; Wagner, Brent K ; Summers, Christopher J ; Lawrence, William ; Nagarkar, Vivek

Applied physics letters, 2011-05, Vol.98 (18), p.181914-181914 [Periódico revisado por pares]

United States: American Institute of Physics

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5
Epitaxial graphene on cubic SiC(111)/Si(111) substrate
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Epitaxial graphene on cubic SiC(111)/Si(111) substrate

Ouerghi, A ; Kahouli, A ; Lucot, D ; Portail, M ; Travers, L ; Gierak, J ; Penuelas, J ; Jegou, P ; Shukla, A ; Chassagne, T ; Zielinski, M

Applied physics letters, 2010-05, Vol.96 (19), p.191910-191910-3 [Periódico revisado por pares]

United States: American Institute of Physics

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6
Optical interband transitions in relaxor-based ferroelectric 0.93Pb(Zn1/3Nb2/3)O3–0.07PbTiO3 single crystal
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Optical interband transitions in relaxor-based ferroelectric 0.93Pb(Zn1/3Nb2/3)O3–0.07PbTiO3 single crystal

Sun, Enwei ; Zhang, Rui ; Wang, Zhu ; Xu, Dapeng ; Li, Liang ; Cao, Wenwu

Journal of applied physics, 2010-06, Vol.107 (11) [Periódico revisado por pares]

American Institute of Physics

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7
Correlation of structural properties with energy transfer of Eu-doped ZnO thin films prepared by sol-gel process and magnetron reactive sputtering
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Correlation of structural properties with energy transfer of Eu-doped ZnO thin films prepared by sol-gel process and magnetron reactive sputtering

Petersen, Julien ; Brimont, Christelle ; Gallart, Mathieu ; Schmerber, Guy ; Gilliot, Pierre ; Ulhaq-Bouillet, Corinne ; Rehspringer, Jean-Luc ; Colis, Silviu ; Becker, Claude ; Slaoui, Abdelillah ; Dinia, Aziz

Journal of applied physics, 2010-06, Vol.107 (12), p.123522-123522-6 [Periódico revisado por pares]

United States: American Institute of Physics

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8
Semipolar r-plane ZnO films on Si(100) substrates: Thin film epitaxy and optical properties
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Semipolar r-plane ZnO films on Si(100) substrates: Thin film epitaxy and optical properties

Aggarwal, Ravi ; Zhou, Honghui ; Jin, Chunming ; Narayan, J ; Narayan, Roger J

Journal of applied physics, 2010-06, Vol.107 (11), p.113530-113530-6 [Periódico revisado por pares]

United States: American Institute of Physics

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9
Optical and electrical properties of gallium-doped MgxZn1−xO
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Optical and electrical properties of gallium-doped MgxZn1−xO

Wei, Wei ; Jin, Chunming ; Narayan, Jagdish ; Narayan, Roger J.

Journal of applied physics, 2010-01, Vol.107 (1) [Periódico revisado por pares]

American Institute of Physics

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10
Transformation twinning of Ni-Mn-Ga characterized with temperature-controlled atomic force microscopy
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Transformation twinning of Ni-Mn-Ga characterized with temperature-controlled atomic force microscopy

Reinhold, Matthew ; Watson, Chad ; Knowlton, William B ; Müllner, Peter

Journal of applied physics, 2010-06, Vol.107 (11), p.113501-113501-7 [Periódico revisado por pares]

United States: American Institute of Physics

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