skip to main content
Idioma:
Primo Advanced Search
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search prefilters
Busca Simples
Refinado por: Nome da Publicação: Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms remover data de publicação: 2003Até2005 remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Direct observation of structural relaxation in amorphous compound semiconductors
Direct observation of structural relaxation in amorphous compound semiconductors
Material Type:
Artigo 		Adicionar ao Meu Espaço

Direct observation of structural relaxation in amorphous compound semiconductors

Azevedo, G.de M. ; Glover, C.J. ; Yu, K.M. ; Foran, G.J. ; Ridgway, M.C.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2003-05, Vol.206 (Complete), p.1024-1027 [Periódico revisado por pares]

United States: Elsevier B.V

Texto completo disponível

Citações Citado por
2
EXAFS measurements of metal-decorated nanocavities in Si
EXAFS measurements of metal-decorated nanocavities in Si
Material Type:
Artigo 		Adicionar ao Meu Espaço

EXAFS measurements of metal-decorated nanocavities in Si

Azevedo, G.de M. ; Ridgway, M.C. ; Betlehem, J. ; Yu, K.M. ; Glover, C.J. ; Foran, G.J.

3rd International Conference on Synchrotron Radiation in Materials Science,Singapore, Singapore,2002-01-21 - 2002-01-24, 2003, Vol.199 (Complete), p.179-184 [Periódico revisado por pares]

United States: Elsevier B.V

Texto completo disponível

Citações Citado por
3
EXAFS characterisation of Ge nanocrystals in silica
EXAFS characterisation of Ge nanocrystals in silica
Material Type:
Artigo 		Adicionar ao Meu Espaço

EXAFS characterisation of Ge nanocrystals in silica

Ridgway, M.C. ; Azevedo, G.de M. ; Glover, C.J. ; Elliman, R.G. ; Llewellyn, D.J. ; Cheung, A. ; Johannessen, B. ; Brett, D.A. ; Foran, G.J.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-06, Vol.218, p.421-426 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
4
Common structure in amorphised compound semiconductors
Common structure in amorphised compound semiconductors
Material Type:
Artigo 		Adicionar ao Meu Espaço

Common structure in amorphised compound semiconductors

Ridgway, M.C. ; Azevedo, G.de M. ; Glover, C.J. ; Yu, K.M. ; Foran, G.J.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2003, Vol.199, p.235-239 [Periódico revisado por pares]

United States: Elsevier B.V

Texto completo disponível

Citações Citado por
5
Effect of hydrogenation on the optical and structural properties of GaAs thin films prepared by rf-magnetron sputtering
Effect of hydrogenation on the optical and structural properties of GaAs thin films prepared by rf-magnetron sputtering
Material Type:
Artigo 		Adicionar ao Meu Espaço

Effect of hydrogenation on the optical and structural properties of GaAs thin films prepared by rf-magnetron sputtering

Azevedo, G. de M. ; Dias da Silva, J.H. ; Avendaño, E.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2005-08, Vol.238 (1-4), p.329-333 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por
6
Structure in amorphous semiconductors: Extrinsic and intrinsic
Structure in amorphous semiconductors: Extrinsic and intrinsic
Material Type:
Artigo 		Adicionar ao Meu Espaço

Structure in amorphous semiconductors: Extrinsic and intrinsic

Ridgway, M.C. ; Glover, C.J. ; Azevedo, G. de M. ; Kluth, S.M. ; Yu, K.M. ; Foran, G.J.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2005-08, Vol.238 (1-4), p.294-301 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Citações Citado por

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.