Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
![]() |
EXAFS measurements of metal-decorated nanocavities in SiAzevedo, G.de M. ; Ridgway, M.C. ; Betlehem, J. ; Yu, K.M. ; Glover, C.J. ; Foran, G.J.3rd International Conference on Synchrotron Radiation in Materials Science,Singapore, Singapore,2002-01-21 - 2002-01-24, 2003, Vol.199 (Complete), p.179-184 [Periódico revisado por pares]United States: Elsevier B.VTexto completo disponível |