Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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2 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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3 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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4 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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5 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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6 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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7 |
Material Type: Livro
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Computer Vision – ECCV 2014Fleet Tomas Pajdla; Bernt Schiele; Tinne TuytelaarsSpringer International Publishing 2014Acesso online |
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8 |
Material Type: Ata de Congresso
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Fine-Grained Categorization by AlignmentsGavves, E. ; Fernando, B. ; Snoek, C. G. M. ; Smeulders, A. W. M. ; Tuytelaars, T.2013 IEEE International Conference on Computer Vision, 2013, p.1713-1720IEEETexto completo disponível |
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9 |
Material Type: Artigo
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A Comparison of Affine Region DetectorsMikolajczyk, K. ; Tuytelaars, T. ; Schmid, C. ; Zisserman, A. ; Matas, J. ; Schaffalitzky, F. ; Kadir, T. ; Gool, L. VanInternational journal of computer vision, 2005-11, Vol.65 (1-2), p.43-72 [Periódico revisado por pares]New York: Springer Nature B.VTexto completo disponível |
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10 |
Material Type: Artigo
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A Thousand Words in a SceneQuelhas, P. ; Monay, F. ; Odobez, J.-M. ; Gatica-Perez, D. ; Tuytelaars, T.IEEE transactions on pattern analysis and machine intelligence, 2007-09, Vol.29 (9), p.1575-1589 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |