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1
Recrystallization, Precipitation Behaviors, and Refinement of Austenite Grains in High Mn, High Nb Steel
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Recrystallization, Precipitation Behaviors, and Refinement of Austenite Grains in High Mn, High Nb Steel

Miao, C. L. ; Shang, C. J. ; Zurob, H. S. ; Zhang, G. D. ; Subramanian, S. V.

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2012-02, Vol.43 (2), p.665-676 [Peer Reviewed Journal]

Boston: Springer US

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2
The Effect of the Second Phase on the Anti-scaling Property of Enamel Steel DC04EK
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The Effect of the Second Phase on the Anti-scaling Property of Enamel Steel DC04EK

Liu, Mei-Ling ; Tang, Heng-Qiang ; Yan, Wenchao ; Subramanian, S. V.

Metallography, microstructure, and analysis, 2022-08, Vol.11 (4), p.595-601

New York: Springer US

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3
Analysis of Precipitation of NbC in Low Reduction Ratio Conditions
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Analysis of Precipitation of NbC in Low Reduction Ratio Conditions

Liu, Mei-Ling ; Zhu, Guo-Hui ; Tang, Heng-Qiang ; Ma, Xiao-Ping ; Subramanian, S. V.

Metallography, microstructure, and analysis, 2021-06, Vol.10 (3), p.377-382

New York: Springer US

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4
Structure–Property–Fracture Mechanism Correlation in Heat-Affected Zone of X100 Ferrite−Bainite Pipeline Steel
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Structure–Property–Fracture Mechanism Correlation in Heat-Affected Zone of X100 Ferrite−Bainite Pipeline Steel

Li, Xueda ; Ma, Xiaoping ; Subramanian, S. V. ; Misra, R. D. K. ; Shang, Chengjia

Metallurgical and materials transactions. E, Materials for energy systems, 2015-03, Vol.2 (1), p.1-11 [Peer Reviewed Journal]

Boston: Springer US

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5
Chemical and structural stability of porous thin film NiO nanowire based electrodes for supercapacitors
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Chemical and structural stability of porous thin film NiO nanowire based electrodes for supercapacitors

Paravannoor, Anjali ; Ranjusha, R. ; Asha, A.M. ; Vani, R. ; Kalluri, Sujith ; Subramanian, K.R.V. ; Sivakumar, N. ; Kim, T.N. ; Nair, Shantikumar V. ; Balakrishnan, A.

Chemical engineering journal (Lausanne, Switzerland : 1996), 2013-03, Vol.220, p.360-366 [Peer Reviewed Journal]

Oxford: Elsevier B.V

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6
Large photovoltaic response in rare-earth doped BiFeO3 polycrystalline thin films near morphotropic phase boundary composition
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Large photovoltaic response in rare-earth doped BiFeO3 polycrystalline thin films near morphotropic phase boundary composition

Biswas, Pranab Parimal ; Pal, Subhajit ; Subramanian, V. ; Murugavel, P.

Applied physics letters, 2019-04, Vol.114 (17) [Peer Reviewed Journal]

Melville: American Institute of Physics

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7
Biocompatibility study of nanocomposite titanium boron nitride (TiBN) thin films for orthopedic implant applications
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Biocompatibility study of nanocomposite titanium boron nitride (TiBN) thin films for orthopedic implant applications

V.V., Anusha Thampi ; Chukwuike, V.I. ; Shtansky, Dmitry V. ; Subramanian, B.

Surface & coatings technology, 2021-03, Vol.410, p.126968, Article 126968 [Peer Reviewed Journal]

Lausanne: Elsevier B.V

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8
A comparative study of titanium nitride (TiN), titanium oxy nitride (TiON) and titanium aluminum nitride (TiAlN), as surface coatings for bio implants
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A comparative study of titanium nitride (TiN), titanium oxy nitride (TiON) and titanium aluminum nitride (TiAlN), as surface coatings for bio implants

Subramanian, B. ; Muraleedharan, C.V. ; Ananthakumar, R. ; Jayachandran, M.

Surface & coatings technology, 2011, Vol.205 (21), p.5014-5020 [Peer Reviewed Journal]

Amsterdam: Elsevier B.V

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9
Ag induced electromagnetic interference shielding of Ag-graphite/PVDF flexible nanocomposites thinfilms
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Ag induced electromagnetic interference shielding of Ag-graphite/PVDF flexible nanocomposites thinfilms

Kumaran, R. ; Alagar, M. ; Dinesh Kumar, S. ; Subramanian, V. ; Dinakaran, K.

Applied physics letters, 2015-09, Vol.107 (11) [Peer Reviewed Journal]

Melville: American Institute of Physics

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10
High-Performance Chemical-Bath-Deposited Zinc Oxide Thin-Film Transistors
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High-Performance Chemical-Bath-Deposited Zinc Oxide Thin-Film Transistors

Redinger, D. ; Subramanian, V.

IEEE transactions on electron devices, 2007-06, Vol.54 (6), p.1301-1307 [Peer Reviewed Journal]

New York, NY: IEEE

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