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Handbook of surface and interface analysis : methods for problem-solving
Handbook of surface and interface analysis : methods for problem-solving
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Handbook of surface and interface analysis : methods for problem-solving

J. C Rivière; S Myhra (Sverre), 1943-

Boca Raton : CRC Press c2009

Localização: IQSC - Inst. Química de São Carlos    (R541.33 R526h2 )(Acessar)

2
Tip-induced oxidative nano-machining of conducting diamond-like carbon (DLC)
Tip-induced oxidative nano-machining of conducting diamond-like carbon (DLC)
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Tip-induced oxidative nano-machining of conducting diamond-like carbon (DLC)

MYHRA, S

Applied physics. A, Materials science & processing, 2005-02, Vol.80 (5), p.1097-1104 [Periódico revisado por pares]

Berlin: Springer

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3
Alpha and recoil track detection in poly(methyl methacrylate) (PMMA)—Towards a method for in vitro assessment of radiopharmaceuticals internalized in cancer cells
Alpha and recoil track detection in poly(methyl methacrylate) (PMMA)—Towards a method for in vitro assessment of radiopharmaceuticals internalized in cancer cells
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Alpha and recoil track detection in poly(methyl methacrylate) (PMMA)—Towards a method for in vitro assessment of radiopharmaceuticals internalized in cancer cells

Myhra, S. ; Falzone, N. ; Chakalova, R.

Review of scientific instruments, 2014-03, Vol.85 (3), p.034302 [Periódico revisado por pares]

United States: American Institute of Physics

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4
Manipulation of Si oxide and electrically conducting carbon films by scanning probe microscopy (SPM): nano-lithography and nano-machining
Manipulation of Si oxide and electrically conducting carbon films by scanning probe microscopy (SPM): nano-lithography and nano-machining
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Manipulation of Si oxide and electrically conducting carbon films by scanning probe microscopy (SPM): nano-lithography and nano-machining

Myhra, S

Thin solid films, 2004-07, Vol.459 (1), p.90-94 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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5
Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy
Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy
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Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy

Myhra, S.

Applied physics. A, Materials science & processing, 2003-01, Vol.76 (1), p.63-69 [Periódico revisado por pares]

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6
Spatial distribution of Auger electrons emitted from internalised radionuclides in cancer cells: the photoresist autoradiography (PAR) method
Spatial distribution of Auger electrons emitted from internalised radionuclides in cancer cells: the photoresist autoradiography (PAR) method
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Spatial distribution of Auger electrons emitted from internalised radionuclides in cancer cells: the photoresist autoradiography (PAR) method

Royle, G ; Myhra, S ; Chakalova, R ; Vallis, K A ; Falzone, N

Radiation protection dosimetry, 2015-09, Vol.166 (1-4), p.228-232 [Periódico revisado por pares]

England

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7
Crystal-chemistry of the Ti3AlC2 and Ti4AlN3 layered carbide/nitride phases-characterization by XPS
Crystal-chemistry of the Ti3AlC2 and Ti4AlN3 layered carbide/nitride phases-characterization by XPS
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Crystal-chemistry of the Ti3AlC2 and Ti4AlN3 layered carbide/nitride phases-characterization by XPS

MYHRA, S ; CROSSLEY, J. A. A ; BARSOUM, M. W

The Journal of physics and chemistry of solids, 2001-04, Vol.62 (4), p.811-817 [Periódico revisado por pares]

Oxford: Elsevier

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8
Modelled Distribution and Temporal Evolution of Permafrost in Steep Rock Walls Along a Latitudinal Transect in Norway by CryoGrid 2D
Modelled Distribution and Temporal Evolution of Permafrost in Steep Rock Walls Along a Latitudinal Transect in Norway by CryoGrid 2D
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Modelled Distribution and Temporal Evolution of Permafrost in Steep Rock Walls Along a Latitudinal Transect in Norway by CryoGrid 2D

Myhra, K. S. ; Westermann, S. ; Etzelmüller, B.

Permafrost and periglacial processes, 2017-01, Vol.28 (1), p.172-182 [Periódico revisado por pares]

Chichester: Wiley Subscription Services, Inc

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9
The Raman Modes of the Aurivillius Phases: Temperature and Polarization Dependence
The Raman Modes of the Aurivillius Phases: Temperature and Polarization Dependence
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The Raman Modes of the Aurivillius Phases: Temperature and Polarization Dependence

Graves, P.R. ; Hua, G. ; Myhra, S. ; Thompson, J.G.

Journal of solid state chemistry, 1995, Vol.114 (1), p.112-122 [Periódico revisado por pares]

San Diego, CA: Elsevier Inc

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10
Ti3SiC2 - A LAYERED CERAMIC EXHIBITING ULTRA-LOW FRICTION
Ti3SiC2 - A LAYERED CERAMIC EXHIBITING ULTRA-LOW FRICTION
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Ti3SiC2 - A LAYERED CERAMIC EXHIBITING ULTRA-LOW FRICTION

Myhra, S ; Summers J, W B ; Kisi, E H WCA

Materials letters, 1999, Vol.39 (1), p.6-11 [Periódico revisado por pares]

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