Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Models for the modern power gridCardieri, Paulo, 1964- Universidade Estadual de Campinas (Unicamp); Universidade Estadual De Campinashttps://repositorio.unicamp.br/acervo/detalhe/11912042014Acesso online |
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2 |
Material Type: Resenha
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Type-Driven Development with IdrisDE MUIJNCK-HUGHES, JANJournal of Functional Programming, 2020, Vol.30, Article e16 [Periódico revisado por pares]Cambridge: Cambridge University PressTexto completo disponível |
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3 |
Material Type: Resenha
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Modeling and analysis of communicating systemsRossi, MatteoFormal Aspects of Computing, 2021, Vol.33 (2), p.297-298 [Periódico revisado por pares]London: Springer Nature B.VTexto completo disponível |
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4 |
Material Type: Resenha
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Ranking algorithm for book reviews with user tendency and collective intelligenceRyang, Heungmo ; Yun, Unil ; Pyun, Gwangbum ; Lee, Gangin ; Kim, JiwonMultimedia Tools and Applications, 2015, Vol.74 (16), p.6209-6227 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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5 |
Material Type: Resenha
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IBM Rational Unified Process Reference and Certification Guide Solution DesignerAshbacher, CharlesJournal of object technology, 2008, Vol.7 (6), p.53Texto completo disponível |
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6 |
Material Type: Resenha
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Virtual Unix for PCsJagadeesh, J MComputer, 1995, Vol.28 (8), p.94 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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7 |
Material Type: Resenha
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WINCheckIt version 2.0Murphy, Heidemarie JComputer, 1995, Vol.28 (8), p.94 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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8 |
Material Type: Resenha
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A coherent filing-and-retrieval systemBergmann, GregoryComputer, 1995, Vol.28 (2), p.82 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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9 |
Material Type: Resenha
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Synario 1.0Jagadeesh, J MComputer, 1994, Vol.27 (5), p.82 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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10 |
Material Type: Resenha
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Commentary: author reply to a book reviewBirolini, A.IEEE Transactions on Reliability, 2003, Vol.52 (1), p.9-9 [Periódico revisado por pares]New York: IEEETexto completo disponível |