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Refinado por: Base de dados/Biblioteca: ANTE: Abstracts in New Technology & Engineering remover Base de dados/Biblioteca: Journals@Ovid Complete remover
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1
Energy doubling of 42 GeV electrons in a metre-scale plasma wakefield accelerator
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Energy doubling of 42 GeV electrons in a metre-scale plasma wakefield accelerator

Clayton, Christopher E ; Decker, Franz-Josef ; Walz, Dieter ; Blumenfeld, Ian ; Ischebeck, Rasmus ; Siemann, Robert H ; Oz, Erdem ; Zhou, Miaomiao ; Katsouleas, Thomas ; Kirby, Neil ; Marsh, Kenneth A ; Huang, Chengkun ; Joshi, Chandrashekhar ; Muggli, Patric ; Lu, Wei ; Iverson, Richard ; Mori, Warren B ; Hogan, Mark J

Nature, 2007-02, Vol.445 (7129), p.741-744 [Periódico revisado por pares]

London: Nature Publishing

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2
Spin-Dependent WIMP Limits from a Bubble Chamber
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Spin-Dependent WIMP Limits from a Bubble Chamber

Behnke, E ; Collar, J.I ; Cooper, P.S ; Crum, K ; Crisler, M ; Hu, M ; Levine, I ; Nakazawa, D ; Nguyen, H ; Odom, B ; Ramberg, E ; Rasmussen, J ; Riley, N ; Sonnenschein, A ; Szydagis, M ; Tschirhart, R

Science (American Association for the Advancement of Science), 2008-02, Vol.319 (5865), p.933-936 [Periódico revisado por pares]

Washington, DC: American Association for the Advancement of Science

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3
Experimental detection of α-particles from the radioactive decay of natural bismuth
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Experimental detection of α-particles from the radioactive decay of natural bismuth

Coron, Noël ; de Marcillac, Pierre ; Dambier, Gérard ; Leblanc, Jacques ; Moalic, Jean-Pierre

Nature (London), 2003-04, Vol.422 (6934), p.876-878 [Periódico revisado por pares]

London: Nature Publishing

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4
Route to the Brightest Possible Neutron Source
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Route to the Brightest Possible Neutron Source

Taylor, Andrew ; Dunne, Mike ; Bennington, Steve ; Ansell, Stuart ; Gardner, Ian ; Norreys, Peter ; Broome, Tim ; Findlay, David ; Nelmes, Richard

Science (American Association for the Advancement of Science), 2007-02, Vol.315 (5815), p.1092-1095 [Periódico revisado por pares]

Washington, DC: American Association for the Advancement of Science

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5
Observation of high-energy neutrinos using Cerenkov detectors embedded deep in Antarctic ice
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Observation of high-energy neutrinos using Cerenkov detectors embedded deep in Antarctic ice

ANDRES, E ; ASKEBJER, P ; BIRON, A ; BOOTH, J ; BOTNER, O ; BOUCHTA, A ; BOYCE, M. M ; CARIUS, S ; CHEN, A ; CHIRKIN, D ; CONRAD, J ; COOLEY, J ; BAI, X ; COSTA, C. G. S ; COWEN, D. F ; DAILING, J ; DALBERG, E ; DEYOUNG, T ; DESIATI, P ; DEWULF, J.-P ; DOKSUS, P ; EDSJÖ, J ; EKSTRÖM, P ; BAROUCH, G ; ERLANDSSON, B ; FESER, T ; GAUG, M ; GOLDSCHMIDT, A ; GOOBAR, A ; GRAY, L ; HAASE, H ; HALLGREN, A ; HALZEN, F ; HANSON, K ; BARWICK, S. W ; HARDTKE, R ; HE, Y. D ; HELLWIG, M ; HEUKENKAMP, H ; HILL, G. C ; HULTH, P. O ; HUNDERTMARK, S ; JACOBSEN, J ; KANDHADAI, V ; KARLE, A ; BAY, R. C ; KIM, J ; KOCI, B ; KÖPKE, L ; KOWALSKI, M ; LEICH, H ; LEUTHOLD, M ; LINDAHL, P ; LIUBARSKY, I ; LOAIZA, P ; LOWDER, D. M ; BECKER, K.-H ; BERGSTRÖM, L ; BERTRAND, D ; BIERENBAUM, D

Nature (London), 2001-03, Vol.410 (6827), p.441-443 [Periódico revisado por pares]

London: Nature Publishing

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6
Electrical, optical and structural properties of lead iodide
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Electrical, optical and structural properties of lead iodide

Matuchova, Marie ; Zdansky, Karel ; Zavadil, Jiri ; Danilewsky, Andreas ; Maixner, Jaroslav ; Alexiev, Dimitri

Journal of materials science. Materials in electronics, 2009-03, Vol.20 (3), p.289-294 [Periódico revisado por pares]

Boston: Springer US

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7
White beam topography of 300 mm Si wafers
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White beam topography of 300 mm Si wafers

Danilewsky, A. N. ; Wittge, J. ; Rack, A. ; Weitkamp, T. ; Simon, R. ; Baumbach, T. ; McNally, P.

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.269-272 [Periódico revisado por pares]

Boston: Springer US

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8
In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAs
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In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAs

Reentilä, O. ; Lankinen, A. ; Mattila, M. ; Säynätjoki, A. ; Tuomi, T. O. ; Lipsanen, H. ; O’Reilly, L. ; McNally, P. J.

Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.137-142 [Periódico revisado por pares]

Boston: Springer US

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