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ANTE: Abstracts in New Technology & Engineering
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Engineered Materials Abstracts
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Materials Research Database
Journals@Ovid Complete
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Engineered Materials Abstracts
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Materials Research Database
Journals@Ovid Complete
| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Energy doubling of 42 GeV electrons in a metre-scale plasma wakefield acceleratorClayton, Christopher E ; Decker, Franz-Josef ; Walz, Dieter ; Blumenfeld, Ian ; Ischebeck, Rasmus ; Siemann, Robert H ; Oz, Erdem ; Zhou, Miaomiao ; Katsouleas, Thomas ; Kirby, Neil ; Marsh, Kenneth A ; Huang, Chengkun ; Joshi, Chandrashekhar ; Muggli, Patric ; Lu, Wei ; Iverson, Richard ; Mori, Warren B ; Hogan, Mark JNature, 2007-02, Vol.445 (7129), p.741-744 [Periódico revisado por pares]London: Nature PublishingTexto completo disponível |
| 2 |
Material Type: Artigo
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Spin-Dependent WIMP Limits from a Bubble ChamberBehnke, E ; Collar, J.I ; Cooper, P.S ; Crum, K ; Crisler, M ; Hu, M ; Levine, I ; Nakazawa, D ; Nguyen, H ; Odom, B ; Ramberg, E ; Rasmussen, J ; Riley, N ; Sonnenschein, A ; Szydagis, M ; Tschirhart, RScience (American Association for the Advancement of Science), 2008-02, Vol.319 (5865), p.933-936 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
| 3 |
Material Type: Artigo
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Experimental detection of α-particles from the radioactive decay of natural bismuthCoron, Noël ; de Marcillac, Pierre ; Dambier, Gérard ; Leblanc, Jacques ; Moalic, Jean-PierreNature (London), 2003-04, Vol.422 (6934), p.876-878 [Periódico revisado por pares]London: Nature PublishingTexto completo disponível |
| 4 |
Material Type: Artigo
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Route to the Brightest Possible Neutron SourceTaylor, Andrew ; Dunne, Mike ; Bennington, Steve ; Ansell, Stuart ; Gardner, Ian ; Norreys, Peter ; Broome, Tim ; Findlay, David ; Nelmes, RichardScience (American Association for the Advancement of Science), 2007-02, Vol.315 (5815), p.1092-1095 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
| 5 |
Material Type: Artigo
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Observation of high-energy neutrinos using Cerenkov detectors embedded deep in Antarctic iceANDRES, E ; ASKEBJER, P ; BIRON, A ; BOOTH, J ; BOTNER, O ; BOUCHTA, A ; BOYCE, M. M ; CARIUS, S ; CHEN, A ; CHIRKIN, D ; CONRAD, J ; COOLEY, J ; BAI, X ; COSTA, C. G. S ; COWEN, D. F ; DAILING, J ; DALBERG, E ; DEYOUNG, T ; DESIATI, P ; DEWULF, J.-P ; DOKSUS, P ; EDSJÖ, J ; EKSTRÖM, P ; BAROUCH, G ; ERLANDSSON, B ; FESER, T ; GAUG, M ; GOLDSCHMIDT, A ; GOOBAR, A ; GRAY, L ; HAASE, H ; HALLGREN, A ; HALZEN, F ; HANSON, K ; BARWICK, S. W ; HARDTKE, R ; HE, Y. D ; HELLWIG, M ; HEUKENKAMP, H ; HILL, G. C ; HULTH, P. O ; HUNDERTMARK, S ; JACOBSEN, J ; KANDHADAI, V ; KARLE, A ; BAY, R. C ; KIM, J ; KOCI, B ; KÖPKE, L ; KOWALSKI, M ; LEICH, H ; LEUTHOLD, M ; LINDAHL, P ; LIUBARSKY, I ; LOAIZA, P ; LOWDER, D. M ; BECKER, K.-H ; BERGSTRÖM, L ; BERTRAND, D ; BIERENBAUM, DNature (London), 2001-03, Vol.410 (6827), p.441-443 [Periódico revisado por pares]London: Nature PublishingTexto completo disponível |
| 6 |
Material Type: Artigo
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Electrical, optical and structural properties of lead iodideMatuchova, Marie ; Zdansky, Karel ; Zavadil, Jiri ; Danilewsky, Andreas ; Maixner, Jaroslav ; Alexiev, DimitriJournal of materials science. Materials in electronics, 2009-03, Vol.20 (3), p.289-294 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
| 7 |
Material Type: Artigo
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White beam topography of 300 mm Si wafersDanilewsky, A. N. ; Wittge, J. ; Rack, A. ; Weitkamp, T. ; Simon, R. ; Baumbach, T. ; McNally, P.Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.269-272 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
| 8 |
Material Type: Artigo
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In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAsReentilä, O. ; Lankinen, A. ; Mattila, M. ; Säynätjoki, A. ; Tuomi, T. O. ; Lipsanen, H. ; O’Reilly, L. ; McNally, P. J.Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.137-142 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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