Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
Electrical, optical and structural properties of lead iodideMatuchova, Marie ; Zdansky, Karel ; Zavadil, Jiri ; Danilewsky, Andreas ; Maixner, Jaroslav ; Alexiev, DimitriJournal of materials science. Materials in electronics, 2009-03, Vol.20 (3), p.289-294 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
|
2 |
Material Type: Artigo
|
White beam topography of 300 mm Si wafersDanilewsky, A. N. ; Wittge, J. ; Rack, A. ; Weitkamp, T. ; Simon, R. ; Baumbach, T. ; McNally, P.Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.269-272 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
|
3 |
Material Type: Artigo
|
In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAsReentilä, O. ; Lankinen, A. ; Mattila, M. ; Säynätjoki, A. ; Tuomi, T. O. ; Lipsanen, H. ; O’Reilly, L. ; McNally, P. J.Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.137-142 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |