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Refinado por: data de publicação: 2004Até2013 remover tipo de recurso: Recursos Textuais remover
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1
Electronic structure and properties of isoelectronic magic clusters: Al13X (X=H,Au,Li,Na,K,Rb,Cs)
Electronic structure and properties of isoelectronic magic clusters: Al13X (X=H,Au,Li,Na,K,Rb,Cs)
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Electronic structure and properties of isoelectronic magic clusters: Al13X (X=H,Au,Li,Na,K,Rb,Cs)

Ko, Yeon Jae ; Shakya, Anisha ; Wang, Haopeng ; Grubisic, Andrej ; Zheng, Weijun ; Gotz, Matthias ; Gantefor, Gerd ; Bowen, Kit H ; Jena, Puru ; Kiran, Boggavarapu

VCU Scholars Compass 2010

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2
The effect of stair case electron injector design on electron overflow in InGaN light emitting diodes
The effect of stair case electron injector design on electron overflow in InGaN light emitting diodes
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The effect of stair case electron injector design on electron overflow in InGaN light emitting diodes

Zhang, F ; Li, X ; Hafiz, S ; Okur, S ; Avrutin, Vitaliy ; Ozgur, U ; Morkoç, Hadis ; Matulionis, A

VCU Scholars Compass 2013

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3
Determination of the thermal parameters of a clay from heating cell tests
Determination of the thermal parameters of a clay from heating cell tests
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Determination of the thermal parameters of a clay from heating cell tests

Romero Morales, Enrique Edgar ; Lima Amorim, Analice França ; Gens Solé, Antonio ; Vaunat, Jean ; Li, X. L

2013

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4
Degradation in InAlN/AlN/GaN heterostructure field-effect transistors as monitored by low-frequency noise measurements: Hot phonon effects
Degradation in InAlN/AlN/GaN heterostructure field-effect transistors as monitored by low-frequency noise measurements: Hot phonon effects
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Degradation in InAlN/AlN/GaN heterostructure field-effect transistors as monitored by low-frequency noise measurements: Hot phonon effects

Kayis, C ; Ferreyra, Romualdo A ; Wu, M ; Li, X ; Özgür, Ü ; Matulionis, A ; Morkoç, Hadis

VCU Scholars Compass 2011

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5
Analysis of the excavation of a deep drift in a tertiary clay
Analysis of the excavation of a deep drift in a tertiary clay
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Analysis of the excavation of a deep drift in a tertiary clay

Vaunat, Jean ; Gens Solé, Antonio ; de Vasconcelos, R ; Li, X.-L

International Centre for Computational Engineering 2011

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6
Field-assisted emission in AlGaN/GaN heterostructure field-effect transistors using low-frequency noise technique
Field-assisted emission in AlGaN/GaN heterostructure field-effect transistors using low-frequency noise technique
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Field-assisted emission in AlGaN/GaN heterostructure field-effect transistors using low-frequency noise technique

Kayis, Cemil ; Zhu, C. Y ; Wu, Mo ; Li, X ; Özgür, Ümit ; Morkoç, Hadis

VCU Scholars Compass 2011

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7
Hot electron effects on efficiency degradation in InGaN light emitting diodes and designs to mitigate them
Hot electron effects on efficiency degradation in InGaN light emitting diodes and designs to mitigate them
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Hot electron effects on efficiency degradation in InGaN light emitting diodes and designs to mitigate them

Ni, X ; Li, X ; Lee, J ; Liu, S ; Avrutin, V ; Özgür, Ü ; Morkoç, H ; Matulionis, A

VCU Scholars Compass 2010

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8
Improved quantum efficiency in InGaN light emitting diodes with multi-double-heterostructure active regions
Improved quantum efficiency in InGaN light emitting diodes with multi-double-heterostructure active regions
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Improved quantum efficiency in InGaN light emitting diodes with multi-double-heterostructure active regions

Li, X ; Okur, Serdal ; Zhang, F ; Hafiz, S. A ; Avrutin, Vitaliy ; Ozgur, Umit ; Morkoç, Hadis ; Jarašiūnas, K

VCU Scholars Compass 2012

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9
Nonpolar m-plane GaN on patterned Si(112) substrates by metalorganic chemical vapor deposition
Nonpolar m-plane GaN on patterned Si(112) substrates by metalorganic chemical vapor deposition
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Nonpolar m-plane GaN on patterned Si(112) substrates by metalorganic chemical vapor deposition

Ni, X ; Wu, M ; Lee, J ; Li, X ; Baski, A. A ; Özgür, Ü ; Morkoç, Hadis

VCU Scholars Compass 2009

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10
Degradation and phase noise of InAlN/AlN/GaN heterojunction field effect transistors: Implications for hot electron/phonon effects
Degradation and phase noise of InAlN/AlN/GaN heterojunction field effect transistors: Implications for hot electron/phonon effects
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Degradation and phase noise of InAlN/AlN/GaN heterojunction field effect transistors: Implications for hot electron/phonon effects

Zhu, C. Y ; Wu, M ; Kayis, C ; Zhang, F ; Li, X ; Ferreyra, R. A ; Matulionis, A ; Avrutin, Vitaliy ; Ozgur, Umit ; Morkoc, Hadis

VCU Scholars Compass 2012

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