Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Resolving ruthenium: XPS studies of common ruthenium materialsMorgan, David J.Surface and interface analysis, 2015-11, Vol.47 (11), p.1072-1079 [Periódico revisado por pares]Bognor Regis: Blackwell Publishing LtdTexto completo disponível |
2 |
Material Type: Artigo
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Pyrolysis of Coals and Biomass: Analysis of Thermal Breakdown and Its ProductsMorgan, Trevor J ; Kandiyoti, RafaelChemical reviews, 2014-02, Vol.114 (3), p.1547-1607 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
3 |
Material Type: Artigo
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Transient disorder along pathways to amyloidMorgan, Gareth J.Biophysical chemistry, 2022-02, Vol.281, p.106711-106711, Article 106711 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
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The X‐ray photoelectron spectra of Ir, IrO2 and IrCl3 revisitedFreakley, S. J. ; Ruiz‐Esquius, J. ; Morgan, D. J.Surface and interface analysis, 2017-08, Vol.49 (8), p.794-799 [Periódico revisado por pares]Bognor Regis: Wiley Subscription Services, IncTexto completo disponível |
5 |
Material Type: Artigo
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Total synthesis of chiral biaryl natural products by asymmetric biaryl couplingKozlowski, Marisa C ; Morgan, Barbara J ; Linton, Elizabeth CChemical Society reviews, 2009-01, Vol.38 (11), p.3193-3207 [Periódico revisado por pares]EnglandTexto completo disponível |
6 |
Material Type: Artigo
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Barriers to Small Molecule Drug Discovery for Systemic AmyloidosisMorgan, Gareth J.Molecules (Basel, Switzerland), 2021-06, Vol.26 (12), p.3571 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
7 |
Material Type: Artigo
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Electrochemistry in Hollow-Channel Paper Analytical DevicesRenault, Christophe ; Anderson, Morgan J ; Crooks, Richard MJournal of the American Chemical Society, 2014-03, Vol.136 (12), p.4616-4623 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
8 |
Material Type: Artigo
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XPS insights: Asymmetric peak shapes in XPSMorgan, David J.Surface and interface analysis, 2023-08, Vol.55 (8), p.567-571 [Periódico revisado por pares]Bognor Regis: Wiley Subscription Services, IncTexto completo disponível |
9 |
Material Type: Artigo
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Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysisMorgan, David J.Surface and interface analysis, 2023-11, Vol.55 (11), p.845-850 [Periódico revisado por pares]Bognor Regis: Wiley Subscription Services, IncTexto completo disponível |
10 |
Material Type: Artigo
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XPS insights: Sample degradation in X‐ray photoelectron spectroscopyMorgan, David J.Surface and interface analysis, 2023-05, Vol.55 (5), p.331-335 [Periódico revisado por pares]Bognor Regis: Wiley Subscription Services, IncTexto completo disponível |