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Refinado por: tipo de recurso: Anais de Congresso remover
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Automated test input generation for Android: are we there yet?
Automated test input generation for Android: are we there yet?
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Automated test input generation for Android: are we there yet?

Choudhary, Shauvik Roy ; Gorla, Alessandra ; Orso, Alessandro

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.429-440

Piscataway, NJ, USA: IEEE Press

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2
Learning to generate pseudo-code from source code using statistical machine translation
Learning to generate pseudo-code from source code using statistical machine translation
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Learning to generate pseudo-code from source code using statistical machine translation

Oda, Yusuke ; Fudaba, Hiroyuki ; Neubig, Graham ; Hata, Hideaki ; Sakti, Sakriani ; Toda, Tomoki ; Nakamura, Satoshi

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.574-584

Piscataway, NJ, USA: IEEE Press

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3
Do automatically generated unit tests find real faults?: an empirical study of effectiveness and challenges
Do automatically generated unit tests find real faults?: an empirical study of effectiveness and challenges
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Do automatically generated unit tests find real faults?: an empirical study of effectiveness and challenges

Shamshiri, Sina ; Just, René ; Rojas, José Miguel ; Fraser, Gordon ; McMinn, Phil ; Arcuri, Andrea

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.201-211

Piscataway, NJ, USA: IEEE Press

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4
Repairing programs with semantic code search
Repairing programs with semantic code search
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Repairing programs with semantic code search

Ke, Yalin ; Stolee, Kathryn T. ; Goues, Claire Le ; Brun, Yuriy

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.295-306

Piscataway, NJ, USA: IEEE Press

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5
Combining deep learning with information retrieval to localize buggy files for bug reports
Combining deep learning with information retrieval to localize buggy files for bug reports
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Combining deep learning with information retrieval to localize buggy files for bug reports

Lam, An Ngoc ; Nguyen, Anh Tuan ; Nguyen, Hoan Anh ; Nguyen, Tien N.

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.476-481

Piscataway, NJ, USA: IEEE Press

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6
Reverse engineering mobile application user interfaces with REMAUI
Reverse engineering mobile application user interfaces with REMAUI
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Reverse engineering mobile application user interfaces with REMAUI

Nguyen, Tuan Anh ; Csallner, Christoph

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.248-259

Piscataway, NJ, USA: IEEE Press

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7
CodeHow: effective code search based on API understanding and extended boolean model
CodeHow: effective code search based on API understanding and extended boolean model
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CodeHow: effective code search based on API understanding and extended boolean model

Lv, Fei ; Zhang, Hongyu ; Lou, Jian-guang ; Wang, Shaowei ; Zhang, Dongmei ; Zhao, Jianjun

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.260-270

Piscataway, NJ, USA: IEEE Press

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8
Mining user opinions in mobile app reviews: a keyword-based approach
Mining user opinions in mobile app reviews: a keyword-based approach
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Mining user opinions in mobile app reviews: a keyword-based approach

Vu, Phong Minh ; Nguyen, Tam The ; Pham, Hung Viet ; Nguyen, Tung Thanh

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.749-459

Piscataway, NJ, USA: IEEE Press

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9
Cost-efficient sampling for performance prediction of configurable systems
Cost-efficient sampling for performance prediction of configurable systems
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Cost-efficient sampling for performance prediction of configurable systems

Sarkar, Atri ; Guo, Jianmei ; Siegmund, Norbert ; Apel, Sven ; Czarnecki, Krzysztof

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.342-352

Piscataway, NJ, USA: IEEE Press

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10
CLAMI: defect prediction on unlabeled datasets
CLAMI: defect prediction on unlabeled datasets
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CLAMI: defect prediction on unlabeled datasets

Nam, Jaechang ; Kim, Sunghun

Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering, 2015, p.452-463

Piscataway, NJ, USA: IEEE Press

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