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Measuring polarization dependent dispersion of non-polarizing beam splitter cubes with spectrally resolved white light interferometry
Measuring polarization dependent dispersion of non-polarizing beam splitter cubes with spectrally resolved white light interferometry
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Measuring polarization dependent dispersion of non-polarizing beam splitter cubes with spectrally resolved white light interferometry

Csonti, K ; Hanyecz, V ; Mészáros, G ; Kovács, A. P Frenner, Karsten ; Bodermann, Bernd ; Silver, Richard M

SPIE 2017

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Long-Time Behavior for a Class of Semi-linear Viscoelastic Kirchhoff Beams/Plates
Long-Time Behavior for a Class of Semi-linear Viscoelastic Kirchhoff Beams/Plates
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Long-Time Behavior for a Class of Semi-linear Viscoelastic Kirchhoff Beams/Plates

Feng, B. ; Jorge Silva, M. A. ; Caixeta, A. H.

Applied mathematics & optimization, 2020-10, Vol.82 (2), p.657-686 [Periódico revisado por pares]

New York: Springer US

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A Multi-Faceted Approach to Determining the Efficacy of Metal and Metal Oxide Nanoparticles Against Bacterial Biofilms
A Multi-Faceted Approach to Determining the Efficacy of Metal and Metal Oxide Nanoparticles Against Bacterial Biofilms
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A Multi-Faceted Approach to Determining the Efficacy of Metal and Metal Oxide Nanoparticles Against Bacterial Biofilms

Tejpal, Jyoti ; Cross, Richard ; Owen, Lucy ; Paul, Shashi ; Jenkins, Richard ; Armitage, David ; Laird, Katie

Journal of bionanoscience, 2018-10, Vol.12 (5), p.705-714

Stevenson Ranch: American Scientific Publishers

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4
Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices
Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices
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Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices

Uruma, Takeshi ; Tsunemitsu, Chiaki ; Terao, Katsuki ; Nakazawa, Kenta ; Satoh, Nobuo ; Yamamoto, Hidekazu ; Iwata, Futoshi

AIP advances, 2019-11, Vol.9 (11), p.115011-115011-8 [Periódico revisado por pares]

Melville: American Institute of Physics

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