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Refinado por: assunto: Image Processing remover tipo de recurso: Anais de Congresso remover assunto: Digital Image Processing remover
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1
Automatic detection of diabetic retinopathy
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Ata de Congresso
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Automatic detection of diabetic retinopathy

Rajalakshmi, T. ; Nihila S. ; Snekhalatha, U. Tyagi, Avdhesh ; Gupta, Tarun ; Agrawal, Rajeev ; Maurya, Nagendra Kumar ; Sahu, Rohit ; Amardeep

AIP Conference Proceedings, 2023, Vol.2427 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

Sem texto completo

2
A novel material fabrication to detect breast cancer using deep novel classification mechanism
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A novel material fabrication to detect breast cancer using deep novel classification mechanism

Venkatesh, J. ; Titus, Anita ; Janarthanan, R. ; Anitha, C. ; ChirraKesavaReddy ; Ranjith, S. George, Kiran ; Kalidoss, Ramji ; Vinayagam, Mohanavel

AIP Conference Proceedings, 2022, Vol.2405 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

Sem texto completo

3
Pavement segregation detection using support vector machine
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Pavement segregation detection using support vector machine

Fatriansyah, Jaka Fajar ; Kevin, Christofer ; Arunika, Austin ; Ramadheena, Venia Andira Maknun, Imam Jauhari ; Harahap, Yulia Nurliani ; Harwahyu, Ruki ; Ardi, Romadhani ; Fatriansyah, Jaka Fajar ; Irwansyah, Ridho ; Dhelika, Radon ; Pratama, Mochamad Adhiraga ; Kusuma, Andyka ; Lischer, Kenny ; Putra, Wahyuaji Narottama

AIP Conference Proceedings, 2024, Vol.2710 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

Sem texto completo

4
Soft computing based solar follower using Raspberry pi 4B
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Soft computing based solar follower using Raspberry pi 4B

Kumar, Kanhaiya ; Varshney, Lokesh ; Ambikapathy, A. ; Singh, Raunak ; Rai, Yasharth ; Sikriwal, Sarthak ; Prajapati, Rajkishor Singh, Ravendra ; Bhadoria, Vikas Singh ; Shouran, Mokhtar ; Ohene-Akoto, Ing. Justice ; Arunprasad, G ; Ambikapathy, A

AIP Conference Proceedings, 2024, Vol.2816 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

Sem texto completo

5
Ultra-high-precision alignment technology for lens manufacturing used for high-end optics
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Ultra-high-precision alignment technology for lens manufacturing used for high-end optics

Schiffner, Sebastian ; Sure, Thomas Kim, Dae Wook ; Williamson, Ray ; Fähnle, Oliver W

Proceedings of SPIE, the international society for optical engineering, 2013, Vol.8838, p.88380O-88380O-12

SPIE

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6
The use of programmable logic gate matrices in the design of a physical unit to detect the edges of digital images
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The use of programmable logic gate matrices in the design of a physical unit to detect the edges of digital images

Alahmar Haeder Talib Mahde

AIP Conference Proceedings, 2023, Vol.2834 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

Sem texto completo

7
A Vision Enhancement Network for Image Quality Assessment
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A Vision Enhancement Network for Image Quality Assessment

Jiang, Xinyu ; Xu, Jiangbo ; Zou, Ruoyu

2022 International Conference on Culture-Oriented Science and Technology (CoST), 2022, p.109-113

IEEE

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8
Character Recognition of Historical and Cultural Relics Based on Digital Image Processing
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Character Recognition of Historical and Cultural Relics Based on Digital Image Processing

Zhang, Song

2021 5th International Conference on Electronics, Communication and Aerospace Technology (ICECA), 2021, p.799-802

IEEE

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9
Color Enhancement for Portable LCD Displays in Low-Power Mode
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Color Enhancement for Portable LCD Displays in Low-Power Mode

SHIH, Kuang-Tsu ; HUANG, Tai-Hsiang ; CHEN, Homer H

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.8135

Bellingham, Wash: SPIE

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10
Measurement of biomaterial capillary wick of heat pipe using micro-CT scan
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Measurement of biomaterial capillary wick of heat pipe using micro-CT scan

Nugraha, Putri Fadhillah ; Putra, Nandy ; Latief, Fourier Dzar Eljabbar Nugraha, I Gde Dharma ; Kusrini, Eny

AIP Conference Proceedings, 2020, Vol.2255 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

Sem texto completo

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