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Effect of process parameters on defects in large scale components manufactured by direct laser deposition
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Effect of process parameters on defects in large scale components manufactured by direct laser deposition

Masaylo, D. ; Igoshin, S. ; Popovich, A. ; Popovich, V.

Materials today : proceedings, 2020, Vol.30, p.665-671 [Periódico revisado por pares]

Elsevier Ltd

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Effect of microstructure and processing parameters on mechanical strength of multicrystalline silicon solar cells
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Effect of microstructure and processing parameters on mechanical strength of multicrystalline silicon solar cells

Popovich, V A ; Yunus, A ; Janssen, M ; Bennett, I J ; Richardson, I M

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.002222-002226

IEEE

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Selective laser melting of Inconel 718 under high laser power
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Selective laser melting of Inconel 718 under high laser power

Borisov, E.V. ; Popovich, V.A. ; Popovich, A.A. ; Sufiiarov, V.Sh ; Zhu, Jia-Ning ; Starikov, K.A.

Materials today : proceedings, 2020, Vol.30, p.784-788 [Periódico revisado por pares]

Elsevier Ltd

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Application of X-ray computed tomography in silicon solar cells
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Application of X-ray computed tomography in silicon solar cells

Popovich, V A ; Verwaal, W ; Janssen, M ; Bennett, I J ; Richardson, I M

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001759-001764

IEEE

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Hybrid networks for heterogeneous Distributed Maritime Observation Systems
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Hybrid networks for heterogeneous Distributed Maritime Observation Systems

Popovich, V. V.

2012 IEEE First AESS European Conference on Satellite Telecommunications (ESTEL), 2012, p.1-6

IEEE

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6
Stress measurement by X-ray diffraction in multicrystalline silicon solar cells
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Stress measurement by X-ray diffraction in multicrystalline silicon solar cells

Popovich, V. A. ; van der Pers, N. M. ; Janssen, M. ; Bennett, I. J. ; Richardson, I. M.

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001119-001123

IEEE

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7
Residual and bending stress measurements by X-ray diffraction and synchrotron diffraction analysis in silicon solar cells
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Residual and bending stress measurements by X-ray diffraction and synchrotron diffraction analysis in silicon solar cells

Popovich, V. A. ; van der Pers, N. ; Janssen, M. ; Bennett, I. J. ; Jansen, K. M. B. ; Wright, J. ; Richardson, I. M.

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.000442-000447

IEEE

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8
Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: Relation to microstructure, defects and processing conditions
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Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: Relation to microstructure, defects and processing conditions

Popovich, V. A. ; Westra, J. M. ; van Swaaij, R. A. C. M. M. ; Janssen, M. ; Bennett, I. J. ; Richardson, I. M.

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001668-001673

IEEE

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9
Combined approach to tactical situations analysis
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Combined approach to tactical situations analysis

Popovich, V.V. ; Prokaev, A.N. ; Smirnova, O.V. ; Galiano, F.R.

MILCOM 2008 - 2008 IEEE Military Communications Conference, 2008, p.1-7

IEEE

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10
Microstructural and mechanical characterisation of Al back contact layers and its application to thermomechanical mulitscale modeling of solar cells
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Microstructural and mechanical characterisation of Al back contact layers and its application to thermomechanical mulitscale modeling of solar cells

Popovich, V.A. ; van Amstel, T. ; Bennett, I.J. ; Janssen, M. ; Richardson, I.M.

2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 2009, p.001190-001195

IEEE

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