Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: magazinearticle
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Current State of Multivariate CryptographyDing, Jintai ; Petzoldt, AlbrechtIEEE security & privacy, 2017, Vol.15 (4), p.28-36New York: IEEETexto completo disponível |
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2 |
Material Type: magazinearticle
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Postquantum Cryptography-State of the ArtBuchmann, Johannes ; Lauter, Kristin ; Mosca, MicheleIEEE security & privacy, 2017, Vol.15 (4), p.12-13New York: IEEETexto completo disponível |
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3 |
Material Type: magazinearticle
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The Day the Cryptography DiesMulholland, John ; Mosca, Michele ; Braun, JohannesIEEE security & privacy, 2017, Vol.15 (4), p.14-21New York: IEEETexto completo disponível |
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4 |
Material Type: magazinearticle
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Hash-Based Signatures: State of PlayButin, DenisIEEE security & privacy, 2017, Vol.15 (4), p.37-43New York: IEEETexto completo disponível |
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5 |
Material Type: magazinearticle
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Quantum Cryptanalysis: Shor, Grover, and BeyondJordan, Stephen P. ; Liu, Yi-KaiIEEE security & privacy, 2018-09, Vol.16 (5), p.14-21IEEETexto completo disponível |
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6 |
Material Type: magazinearticle
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Cryptography Standards in Quantum Time: New Wine in an Old Wineskin?Chen, LidongIEEE security & privacy, 2017, Vol.15 (4), p.51-57United States: IEEETexto completo disponível |
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7 |
Material Type: magazinearticle
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Opportunities in White-Box CryptographyMichiels, WilIEEE security & privacy, 2010-01, Vol.8 (1), p.64-67IEEETexto completo disponível |
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8 |
Material Type: magazinearticle
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Code-Based Cryptography: State of the Art and PerspectivesSendrier, NicolasIEEE security & privacy, 2017, Vol.15 (4), p.44-50New York: IEEETexto completo disponível |
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9 |
Material Type: magazinearticle
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Tamarin: Verification of Large-Scale, Real-World, Cryptographic ProtocolsBasin, David ; Cremers, Cas ; Dreier, Jannik ; Sasse, RalfIEEE security & privacy, 2022-05, Vol.20 (3), p.24-32IEEETexto completo disponível |
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10 |
Material Type: magazinearticle
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Cryptography after the Aliens LandSchneier, BruceIEEE security & privacy, 2018-09, Vol.16 (5), p.86-88IEEETexto completo disponível |