Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Growth kinetics and oxidation behavior of WSi2 coating formed by chemical vapor deposition of Si on W substrateYOON, Jin-Kook ; LEE, Kyung-Whan ; CHUNG, Sung-Jae ; SHON, In-Jin ; DOH, Jung-Mann ; KIM, Gyeung-HoJournal of alloys and compounds, 2006-08, Vol.420 (1-2), p.199-206 [Periódico revisado por pares]Lausanne: ElsevierTexto completo disponível |
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Material Type: Artigo
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Design of Opportunity Tree for Organization’s Process Strategy Decision-Making Based on SPICE Assessment ExperienceSong, Ki Won ; Kim, Haeng Kon ; Lee, Kyung WhanComputational Science and Its Applications - ICCSA 2006, 2006, p.873-882 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergSem texto completo |
3 |
Material Type: Ata de Congresso
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Validation of an Approach for Quantitative Measurement and Prediction ModelSONG, Ki-Won ; PARK, Jeong-Hwan ; LEE, Kyung-WhanLecture notes in computer science, 2005, p.187-200 [Periódico revisado por pares]Berlin: SpringerSem texto completo |
4 |
Material Type: Ata de Congresso
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Object-Oriented Component Identification Method using the Affinity Analysis TechniqueJang, Yoon-Jung ; Kim, Eun-Young ; Lee, Kyung-WhanLecture notes in computer science, 2003, p.317-321 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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Material Type: Artigo
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Introduction and Evaluation of Development System Security Process of ISO/IEC TR 15504Lee, Eun-ser ; Lee, Kyung Whan ; Kim, Tai-hoon ; Jung, Il-HongComputational Science and Its Applications – ICCSA 2004, p.451-460 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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Material Type: Ata de Congresso
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Binary component adaptation technique and supporting toolJeong Ah Kim ; Kyung Whan LeeThird ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05), 2005, p.14-19IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Design of opportunity tree framework for effective process improvement based on quantitative project performanceKi-won Song ; Kyung-whan LeeThird ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05), 2005, p.360-367IEEETexto completo disponível |
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Material Type: Artigo
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Quality assessment criteria in C++ classesHan, Kyu Jung ; Yoon, Jung-Mo ; Kim, Jeong Ah ; Lee, Kyung WhanMicroelectronics and reliability, 1994-02, Vol.34 (2), p.361-368 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
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Material Type: Ata de Congresso
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Analysis of interrater agreement in ISO/IEC 15504-based software process assessmentHye-young Lee ; Ho-Won Jung ; Chang-Shin Chung ; Jong Moo Lee ; Kyung Whan Lee ; Hack Jong JeongProceedings Second Asia-Pacific Conference on Quality Software, 2001, p.341-348IEEETexto completo disponível |
10 |
Material Type: Artigo
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Rashba Effect in Functional Spintronic DevicesKoo, Hyun Cheol ; Kim, Seong Been ; Kim, Hansung ; Park, Tae‐Eon ; Choi, Jun Woo ; Kim, Kyoung‐Whan ; Go, Gyungchoon ; Oh, Jung Hyun ; Lee, Dong‐Kyu ; Park, Eun‐Sang ; Hong, Ik‐Sun ; Lee, Kyung‐JinAdvanced materials (Weinheim), 2020-12, Vol.32 (51), p.e2002117-n/a [Periódico revisado por pares]Germany: Wiley Subscription Services, IncTexto completo disponível |