Physical characterization and reliability aspects of MuGFETs
Cor Claeys Eddy Simoen; J.M Rafi; Marcelo Antonio Pavanello; João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
SBMicro 2007
Pennington The Electrochemical Society 2007
Item não circula. Consulte sua biblioteca.(Acessar)
Sidewall angle influence on the finFET analog parameters
Renato Camargo Giacomini João Antonio Martino 1959-; Marcelo Antonio Pavanello; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
SBMicro 2007
Pennington The Electrochemical Society 2007
Item não circula. Consulte sua biblioteca.(Acessar)
Low temperature operation of undoped body triple-gate finFETs from an analog perspective
Marcelo Antonio Pavanello João Antonio Martino 1959-; Eddy Simoen; Rita Rooyackers; Nadine Collaert; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
SBMicro 2007
Pennington The Electrochemical Society 2007
Item não circula. Consulte sua biblioteca.(Acessar)