The detector control system of the ATLAS SemiConductor Tracker during macro-assembly and integration

Abdesselam, A ; Barr, A ; Basiladze, S ; Bates, R L ; Bell, P ; Bingefors, N ; Bohm, J ; Brenner, R ; Llatas, M Chamizo ; Clark, A ; Codispoti, G ; Colijn, A P ; D'Auria, S ; Dorholt, O ; Doherty, F ; Ferrari, P ; Ferrère, D ; Gornicki, E ; Koperny, S ; Lefèvre, R ; Lindquist, L-E ; Malecki, P ; Mikulec, B ; Mohn, B ; Pater, J ; Pernegger, H ; Phillips, P ; Robichaud-Véronneau, A ; Robinson, D ; Roe, S ; Sandaker, H ; Sfyrla, A ; Stanecka, E ; Stastny, J ; Viehhauser, G ; Vossebeld, J ; Wells, P

Journal of instrumentation, 2008-02, Vol.3 (2), p.P02007-P02007, Article P02007 [Periódico revisado por pares]

IOP Publishing

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