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On the νSiO infrared absorption of polysiloxane films
On the νSiO infrared absorption of polysiloxane films
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On the νSiO infrared absorption of polysiloxane films

Chazalviel, J.-N. ; Rodrigues-Filho, U.P.

Thin solid films, 2012-03, Vol.520 (11), p.3918-3921 [Periódico revisado por pares]

Elsevier B.V

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X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil
X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil
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X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil

Felicissimo, Marcella P. ; Peixoto, José Luis S. ; Tomasi, Roberto ; Azioune, Ammar ; Pireaux, Jean-Jacques ; Houssiau, Laurent ; Rodrigues Filho ¶, Ubirajara P.

Philosophical magazine (Abingdon, England), 2004-11, Vol.84 (32), p.3483-3496 [Periódico revisado por pares]

Abingdon: Taylor & Francis Group

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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