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Refinado por: Nome da Publicação: Thin Solid Films remover
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11
Electrical properties of Al2O3 films for TFEL-devices made with sol-gel technology
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Electrical properties of Al2O3 films for TFEL-devices made with sol-gel technology

VANBESIEN, K ; DE VISSCHERE, P ; SMET, P. F ; POELMAN, D

Thin solid films, 2006-08, Vol.514 (1-2), p.323-328 [Periódico revisado por pares]

Lausanne: Elsevier Science

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12
Inter-relationship between structure and dielectric properties of crystalline anodic zirconia
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Inter-relationship between structure and dielectric properties of crystalline anodic zirconia

Habazaki, H. ; Shimizu, K. ; Nagata, S. ; Asami, K. ; Takayama, K. ; Oda, Y. ; Skeldon, P. ; Thompson, G.E.

Thin solid films, 2005-05, Vol.479 (1), p.144-151 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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13
Temperature stability of thin anodic oxide films in metal/insulator/metal structures: A comparison between tantalum and aluminium oxide
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Temperature stability of thin anodic oxide films in metal/insulator/metal structures: A comparison between tantalum and aluminium oxide

Jeliazova, Yanka ; Kayser, Michael ; Mildner, Beate ; Hassel, Achim Walter ; Diesing, Detlef

Thin solid films, 2006-04, Vol.500 (1), p.330-335 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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14
Development of high dielectric dual phase [Bi4Ti3O12]X–[CaCu3Ti4O12]1−X nanocomposite thin films for modern microelectronic device applications
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Development of high dielectric dual phase [Bi4Ti3O12]X–[CaCu3Ti4O12]1−X nanocomposite thin films for modern microelectronic device applications

Pandirengan, Thiruramanathan ; Arumugam, Marikani ; Durairaj, Madhavan

Thin solid films, 2017-04, Vol.628, p.117-126 [Periódico revisado por pares]

Elsevier B.V

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15
Effect of substrate temperature on growth and electrical properties of pulsed laser deposition grown 0.5Pb(Ni1/3Nb2/3)O3-0.35PbTiO3-0.15PbZrO3 thin films
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Effect of substrate temperature on growth and electrical properties of pulsed laser deposition grown 0.5Pb(Ni1/3Nb2/3)O3-0.35PbTiO3-0.15PbZrO3 thin films

Vadla, Samba Siva ; Ade, Ramesh ; Kulkarni, Ajit R. ; Venkataramani, N.

Thin solid films, 2018-09, Vol.661, p.16-22 [Periódico revisado por pares]

Elsevier B.V

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16
Effect of the growth temperature on the composition and dielectric properties of CaZrO3 thin film by radio frequency magnetron sputtering
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Effect of the growth temperature on the composition and dielectric properties of CaZrO3 thin film by radio frequency magnetron sputtering

Chen, Xiaoyang ; Xie, Bin ; Zhang, Yi ; Wang, Wenwu ; Ding, MingJian ; Yu, Ping

Thin solid films, 2020-08, Vol.708, p.138099, Article 138099 [Periódico revisado por pares]

Elsevier B.V

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17
Effect of thickness on the structural and optical properties of CuO thin films grown by successive ionic layer adsorption and reaction
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Effect of thickness on the structural and optical properties of CuO thin films grown by successive ionic layer adsorption and reaction

Akaltun, Yunus

Thin solid films, 2015-11, Vol.594, p.30-34 [Periódico revisado por pares]

Elsevier B.V

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18
High dielectric constant in CaCu3Ti4O12 thin film prepared by pulsed laser deposition
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High dielectric constant in CaCu3Ti4O12 thin film prepared by pulsed laser deposition

ZHAO, Y. L ; PAN, G. W ; REN, Q. B ; CAO, Y. G ; FENG, L. X ; JIAO, Z. K

Thin solid films, 2003-11, Vol.445 (1), p.7-13 [Periódico revisado por pares]

Lausanne: Elsevier Science

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19
Dielectric and mechanical properties and thermal stability of polyimide–graphene oxide composite films
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Dielectric and mechanical properties and thermal stability of polyimide–graphene oxide composite films

Chen, Minghua ; Yin, Jinghua ; Jin, Rong ; Yao, Lei ; Su, Bo ; Lei, Qingquan

Thin solid films, 2015-06, Vol.584, p.232-237 [Periódico revisado por pares]

Elsevier B.V

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20
Dielectric tunability of barium strontium titanate films prepared by a sol–gel method
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Dielectric tunability of barium strontium titanate films prepared by a sol–gel method

Nayak, M. ; Tseng, Tseung-Yuen

Thin solid films, 2002-04, Vol.408 (1), p.194-199 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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